alex/esp-idf
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Code Issues Actions 3 Packages Projects Releases Wiki Activity
b4e4b9f20d
esp-idf/components/fatfs/test
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Adam Múdry 4a6cc1d2a4 vfs/fatfs: fix failed tests by increasing timeout 
Default 30s timeout is too low for a case when SD card formatting is triggered,
which could lead to tests failure. Timeout of tests is now set to 60s.

JIRA IDFCI-742
2021-08-25 19:04:34 +08:00
..
CMakeLists.txt Whitespace: Automated whitespace fixes (large commit) 2020-11-11 07:36:35 +00:00
component.mk ut: Move tests back from "esp32" subfolder 2020-01-06 17:13:53 +08:00
fatfs.img FATFS support without wear levelling 2018-06-16 16:02:35 +08:00
test_fatfs_common.c fatfs: return EINVAL if truncate length is less than 0 2021-01-13 19:11:48 +08:00
test_fatfs_common.h Whitespace: Automated whitespace fixes (large commit) 2020-11-11 07:36:35 +00:00
test_fatfs_rawflash.c esp_rom: extract common ets apis into esp_rom_sys.h 2020-07-27 15:27:01 +08:00
test_fatfs_sdmmc.c vfs/fatfs: fix failed tests by increasing timeout 2021-08-25 19:04:34 +08:00
test_fatfs_spiflash.c fatfs: fix SPIRAM allocation not used due to Kconfig option name error 2020-09-14 18:30:31 +02:00