esp-idf/components/driver/test_apps/sdio
Konstantin Kondrashov c350c3c504 Merge branch 'feature/cleanup_wrong_log_use' into 'master'
all: Removes unnecessary newline character in logs

Closes IDFGH-10197

See merge request espressif/esp-idf!24131
2023-06-15 21:49:49 +08:00
..
main all: Removes unnecessary newline character in logs 2023-06-09 03:31:21 +08:00
CMakeLists.txt driver:Trim the build components 2023-06-13 14:24:44 +08:00
pytest_sdio.py CI: sdcard tests fail fix 2023-05-10 16:48:03 +02:00
README.md sdio: c6 support 2023-01-18 02:34:46 +00:00
sdkconfig.defaults test: move sdio unit-test to test_apps 2022-11-16 11:22:31 +08:00

Supported Targets ESP32 ESP32-C6