Adam Múdry 3926b436b5 vfs/fatfs: fix failed tests by increasing timeout ... Default 30s timeout is too low for a case when SD card formatting is triggered, which could lead to tests failure. Timeout of tests is now set to 60s. JIRA IDFCI-742		2021-09-21 08:53:18 +02:00
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CMakeLists.txt	Whitespace: Automated whitespace fixes (large commit)	2020-11-11 07:36:35 +00:00
component.mk	ut: Move tests back from "esp32" subfolder	2020-01-06 17:13:53 +08:00
fatfs.img	FATFS support without wear levelling	2018-06-16 16:02:35 +08:00
test_fatfs_common.c	fatfs: return EINVAL if truncate length is less than 0	2021-01-13 19:11:48 +08:00
test_fatfs_common.h	Whitespace: Automated whitespace fixes (large commit)	2020-11-11 07:36:35 +00:00
test_fatfs_rawflash.c	esp_rom: extract common ets apis into esp_rom_sys.h	2020-07-27 15:27:01 +08:00
test_fatfs_sdmmc.c	vfs/fatfs: fix failed tests by increasing timeout	2021-09-21 08:53:18 +02:00
test_fatfs_spiflash.c	fatfs: fix SPIRAM allocation not used due to Kconfig option name error	2020-09-14 18:30:31 +02:00