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1fdf242750
Added a kconfig option. By default, when using ADC oneshot driver, it will disable DAC channels: - ESP32: IO25, IO26 - ESP32S2: IO17, IO18 if ADC2 is in use. You can disable this option, to measure DAC output, via internal ADC. This is for test usage.
60 lines
2.3 KiB
Plaintext
60 lines
2.3 KiB
Plaintext
menu "ADC and ADC Calibration"
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config ADC_ONESHOT_CTRL_FUNC_IN_IRAM
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bool "Place ISR version ADC oneshot mode read function into IRAM"
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default n
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help
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Place ISR version ADC oneshot mode read function into IRAM.
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config ADC_CONTINUOUS_ISR_IRAM_SAFE
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depends on SOC_ADC_DMA_SUPPORTED
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bool "ADC continuous mode driver ISR IRAM-Safe"
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default n
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select GDMA_ISR_IRAM_SAFE if SOC_ADC_DMA_SUPPORTED && SOC_GDMA_SUPPORTED
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help
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Ensure the ADC continuous mode ISR is IRAM-Safe. When enabled, the ISR handler
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will be available when the cache is disabled.
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menu "ADC Calibration Configurations"
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depends on IDF_TARGET_ESP32
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config ADC_CALI_EFUSE_TP_ENABLE
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bool "Use Two Point Values"
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default "y"
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help
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Some ESP32s have Two Point calibration values burned into eFuse BLOCK3.
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This option will allow the ADC calibration component to characterize the
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ADC-Voltage curve using Two Point values if they are available.
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config ADC_CALI_EFUSE_VREF_ENABLE
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bool "Use eFuse Vref"
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default "y"
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help
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Some ESP32s have Vref burned into eFuse BLOCK0. This option will allow
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the ADC calibration component to characterize the ADC-Voltage curve using
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eFuse Vref if it is available.
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config ADC_CALI_LUT_ENABLE
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bool "Use Lookup Tables"
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default "y"
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help
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This option will allow the ADC calibration component to use Lookup Tables
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to correct for non-linear behavior in 11db attenuation. Other attenuations
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do not exhibit non-linear behavior hence will not be affected by this option.
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endmenu
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config ADC_DISABLE_DAC_OUTPUT
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depends on SOC_DAC_SUPPORTED
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bool "Disable DAC when ADC2 is in use"
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default y
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help
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By default, this is set. The ADC oneshot driver will disable the output of the
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corresponding DAC channels:
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ESP32: IO25 and IO26
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ESP32S2: IO17 and IO18
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Disable this option so as to measure the output of DAC by internal ADC, for test usage.
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endmenu
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