esp-idf/components/esp_rom/test
Michael (XIAO Xufeng) 6a8aed12ee ci: partially enable ut tests for esp32c2
Disabled test cases are tracked in:

 IDF-4465, IDF-5045, IDF-5057, IDF-5058, IDF-5059, IDF-5060, IDF-5061, IDF-5131

- test_fatfs: IDF-5136

- test_pm: IDF-5053

- test_cache_mmu: IDF-5138

- test_partitions: IDF-5137

- test_vfs: IDF-5139

- test_freertos: IDF-5140

- test_wpa_supplicant: IDF-5046

- test_mbedtls: IDF-5141

- test_pthread: IDF-5142

- test_protocomm: IDF-5143

- test_lightsleep: IDF-5053

- test_taskwdt: IDF-5055

- test_tcp_transport: IDF-5144

- test_app_update: IDF-5145

- test_timer: IDF-5052

- test_spi: IDF-5146

- test_rtc_clk: IDF-5060

- test_heap: IDF-5167

ci: fixed issues for tests of libgcc, ets_timer, newlib

test_pm: support on C2
2022-06-02 14:23:35 +08:00
..
CMakeLists.txt rom/tjpgd: unify library & add rom patch 2021-09-01 14:42:17 +08:00
logo.jpg esp_rom: move rom api test into esp_rom component 2020-06-03 13:16:13 +08:00
test_libgcc.c ci: partially enable ut tests for esp32c2 2022-06-02 14:23:35 +08:00
test_miniz.c ci: enable previously disabled unit tests 2021-03-29 18:36:41 +08:00
test_tjpgd.c rom/tjpgd: unify library & add rom patch 2021-09-01 14:42:17 +08:00