alex/esp-idf
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esp-idf/components/driver/test
History
morris d0db75899d Merge branch 'bugfix/ledc_consecutive_fade_v4.2' into 'release/v4.2' 
ledc: Bugfixes for issues related to fade protection (backport v4.2)

See merge request espressif/esp-idf!16955
2022-05-07 18:24:45 +08:00
..
adc_dma_test
bugfix(dac): fix testcase fail for dac
2021-03-24 15:50:31 +08:00
dac_dma_test
bugfix(adc): missing ranges of ADC codes in ESP32
2020-10-16 06:34:46 +00:00
include/test
Driver(dac): fix DAC-DMA driver and unit test
2020-09-28 19:35:07 +08:00
param_test
driver: Rename "local" tests to "single board" tests, add some description to the names
2019-12-12 11:05:04 +11:00
touch_sensor_test
ut: fix touch sensor denoise ci fail
2020-08-31 16:01:50 +08:00
CMakeLists.txt
driver/adc: support for esp32s2 adc calibration scheme
2020-08-17 14:43:41 +08:00
component.mk
driver(adc): fix adc io init bug; add unit test to check;
2020-05-12 06:52:26 +00:00
test_adc2_with_wifi.c
esp_wifi: Modify ESP_IF_WIFI_STA to WIFI_IF_STA
2021-03-22 09:09:58 +00:00
test_adc_common.c
driver(adc): fix unit test for ADC-DMA (test_esp32s2.c); fix unit test for ADC-DMA (test_esp32s2.c); fix commit in adc dirver.
2020-07-30 19:38:23 +08:00
test_common_spi.c
spi: re-enable the unit tests for esp32s2beta
2019-12-23 10:22:59 +08:00
test_dac.c
bugfix(dac): fix testcase fail for dac
2021-03-24 15:50:31 +08:00
test_gpio.c
gpio: Fix some gpio pin num errors on esp32s2
2022-03-29 03:40:54 +00:00
test_i2c.c
I2C: i2c.h/i2c.c applied new code formatting
2020-02-26 15:12:03 +08:00
test_i2s.c
driver(I2S): Fix i2s_comm_format_t configuration parameter does not match the TRM bug.
2020-05-18 19:55:30 +08:00
test_ledc.c
ledc: Fix FADE_NO_WAIT mode concurrency problem.
2022-03-29 03:42:06 +00:00
test_pcnt.c
bugfix(pcnt): fix driver ut pcnt
2020-02-26 16:52:53 +08:00
test_pwm.c
ut: Move tests back from "esp32" subfolder
2020-01-06 17:13:53 +08:00
test_rmt.c
rmt: do not support rx wrap on esp32s2
2022-02-13 12:20:20 +08:00
test_rs485.c
Revert "ci: temporarily disable RS485 related tests"
2021-02-23 11:00:37 +08:00
test_rtcio.c
rtcio: add hal for driver
2019-11-21 10:40:49 +08:00
test_sdio.c
sdio: fix the unit of performance test
2020-05-12 12:25:46 +08:00
test_sdmmc_sdspi_init.cpp
sdspi, vfs_fat: allow sharing SPI bus among devices, and mounting multiple SD cards
2020-02-12 15:16:08 +08:00
test_sigmadelta.c
test: driver/sigmadelta test case
2018-06-13 10:15:06 +08:00
test_spi_bus_lock.c
spi: fix config break and reduce overhead of the bus lock on SPI1
2020-04-22 16:06:13 +08:00
test_spi_master.c
spi: allow using esp_flash and spi_master driver on the same bus
2020-03-26 22:08:26 +08:00
test_spi_param.c
spi: add unit test for slave receiving length
2020-03-11 13:24:30 +08:00
test_spi_sio.c
global: rename esp32s2beta to esp32s2
2020-01-22 12:14:38 +08:00
test_spi_slave.c
spi: re-enable the unit tests for esp32s2beta
2019-12-23 10:22:59 +08:00
test_timer.c
driver/timer: fix software reset UT (again)
2019-11-24 21:10:50 +01:00
test_uart.c
driver: add diagnostic information into UART test, enable flow control
2022-02-11 13:47:06 +08:00