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90d1dcfd76
esp-idf/components/fatfs/test_apps
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fl0wl0w 90d1dcfd76 feat(freertos): Introduced new Kconfig option CONFIG_FREERTOS_NUMBER_OF_CORES 
This commit replaces the use of portNUM_PROCESSORS and configNUM_CORES
macros in all of ESP-IDF. These macros are needed to realize an SMP
scenario by fetching the number of active cores FreeRTOS is running on.
Instead, a new Kconfig option, CONFIG_FREERTOS_NUMBER_OF_CORES, has been
added as a proxy for the FreeRTOS config option, configNUMBER_OF_CORES.
This new commit is now used to realize an SMP scenario in various places
in ESP-IDF.

[Sudeep Mohanty: Added new Kconfig option CONFIG_FREERTOS_NUMBER_OF_CORES]

Signed-off-by: Sudeep Mohanty <sudeep.mohanty@espressif.com>
2024-02-09 09:11:28 +01:00
..
flash_ro feat(freertos): Introduced new Kconfig option CONFIG_FREERTOS_NUMBER_OF_CORES 2024-02-09 09:11:28 +01:00
flash_wl feat(fatfs): VFS FATFS add format functions with config argument 2024-01-29 15:09:50 +08:00
sdcard feat(fatfs): VFS FATFS add format functions with config argument 2024-01-29 15:09:50 +08:00
test_fatfs_common feat(freertos): Introduced new Kconfig option CONFIG_FREERTOS_NUMBER_OF_CORES 2024-02-09 09:11:28 +01:00
.build-test-rules.yml build: bypass build issues 2024-01-10 15:34:50 +01:00
README.md fatfs: add missing readme file for the test apps 2022-10-10 12:15:56 +02:00

README.md

fatfs component target tests

This directory contains tests for fatfs component which are run on chip targets.

See also test_fatfs_host directory for the tests which run on a Linux host.

Fatfs tests can be executed with different diskio backends: diskio_sdmmc (SD cards over SD or SPI interface), diskio_spiflash (wear levelling in internal flash) and diskio_rawflash (read-only, no wear levelling, internal flash). There is one test app here for each of these backends:

  • sdcard — runs fatfs tests with an SD card over SDMMC or SDSPI interface
  • flash_wl - runs fatfs test in a wear_levelling partition in SPI flash
  • flash_ro - runs fatfs test in a read-only (no wear levelling) partition in SPI flash

These test apps define:

  • test functions
  • setup/teardown routines
  • build/test configurations
  • pytest test runners

The actual test cases (many of which are common between the test apps) are defined in the test_fatfs_common component.