.. |
components
|
feat(sdio): sdio cross chip test app
|
2023-11-13 11:21:47 +08:00 |
dac_test_apps/legacy_dac_driver
|
refactor(dac): make dac driver as component
|
2023-11-23 12:04:06 +08:00 |
i2s_test_apps
|
ci(i2s): enable i2s ci tests on p4
|
2024-01-19 19:28:33 +08:00 |
legacy_adc_driver
|
fix(adc): rename ADC_ATTEN_DB_11 to ADC_ATTEN_DB_12
|
2023-11-06 18:55:49 +08:00 |
legacy_i2c_driver
|
fix(i2c): test app change gpio
|
2024-01-11 21:44:30 +08:00 |
legacy_mcpwm_driver
|
fix(mcpwm): enable mcpwm group clock before hal init
|
2024-01-15 18:13:56 +08:00 |
legacy_pcnt_driver
|
change(pcnt): reenable the target test for esp32p4
|
2024-01-10 23:03:40 +08:00 |
legacy_rmt_driver
|
ci(p4): enable esp32p4 target test
|
2024-01-04 09:34:55 +08:00 |
legacy_rtc_temp_driver
|
ci(p4): enable esp32p4 target test
|
2024-01-04 09:34:55 +08:00 |
legacy_sigma_delta_driver
|
ci(p4): enable esp32p4 target test
|
2024-01-04 09:34:55 +08:00 |
legacy_timer_driver
|
ci(p4): added todo jira for disabled tests on p4
|
2024-01-04 09:36:38 +08:00 |
touch_sensor_v1
|
driver:Trim the build components
|
2023-06-13 14:24:44 +08:00 |
touch_sensor_v2
|
fix(uart,usj...): Fix wrong serial number that has been parsed to rom functions,
|
2024-01-18 10:51:51 +08:00 |
twai
|
fix(twai): enable twai interactive test for all targets on new std runner
|
2024-01-05 15:22:09 +08:00 |
.build-test-rules.yml
|
feat(i2s): support i2s legacy driver on p4
|
2024-01-19 19:28:33 +08:00 |