alex/esp-idf
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esp-idf/components/driver/test
History
Angus Gratton 3a959ca3e3 Merge branch 'bugfix/ci_driver_gpio_config_s2' into 'master' 
driver test: Don't use ESP32-S2 CS1 pin for output test

Closes IDFCI-112

See merge request espressif/esp-idf!10835
2020-10-15 06:28:20 +08:00
..
adc_dma_test
global: enable build uinit test for esp32-s3
2020-09-22 15:15:03 +08:00
dac_dma_test
global: enable build uinit test for esp32-s3
2020-09-22 15:15:03 +08:00
include/test
dfiver(dac): add dac dma driver and unit test
2020-08-26 06:23:24 +00:00
param_test
driver: Rename "local" tests to "single board" tests, add some description to the names
2019-12-12 11:05:04 +11:00
touch_sensor_test
global: enable build uinit test for esp32-s3
2020-09-22 15:15:03 +08:00
CMakeLists.txt
cmock: added cmock as component
2020-09-02 16:38:37 +08:00
component.mk
driver(adc): fix adc io init bug; add unit test to check;
2020-05-12 06:52:26 +00:00
test_adc2_with_wifi.c
global: enable build uinit test for esp32-s3
2020-09-22 15:15:03 +08:00
test_adc_common.c
global: enable build uinit test for esp32-s3
2020-09-22 15:15:03 +08:00
test_common_spi.c
global: enable build uinit test for esp32-s3
2020-09-22 15:15:03 +08:00
test_dac.c
global: enable build uinit test for esp32-s3
2020-09-22 15:15:03 +08:00
test_gpio.c
driver test: Don't use ESP32-S2 CS1 pin for output test
2020-10-14 16:18:55 +11:00
test_i2c.c
global: enable build uinit test for esp32-s3
2020-09-22 15:15:03 +08:00
test_i2s.c
global: enable build uinit test for esp32-s3
2020-09-22 15:15:03 +08:00
test_ledc.c
global: enable build uinit test for esp32-s3
2020-09-22 15:15:03 +08:00
test_pcnt.c
global: enable build uinit test for esp32-s3
2020-09-22 15:15:03 +08:00
test_pwm.c
global: enable build uinit test for esp32-s3
2020-09-22 15:15:03 +08:00
test_rmt.c
global: enable build uinit test for esp32-s3
2020-09-22 15:15:03 +08:00
test_rs485.c
global: enable build uinit test for esp32-s3
2020-09-22 15:15:03 +08:00
test_rtcio.c
global: enable build uinit test for esp32-s3
2020-09-22 15:15:03 +08:00
test_sdio.c
global: enable build uinit test for esp32-s3
2020-09-22 15:15:03 +08:00
test_sdmmc_sdspi_init.cpp
sdspi, vfs_fat: allow sharing SPI bus among devices, and mounting multiple SD cards
2020-02-12 15:16:08 +08:00
test_sigmadelta.c
global: enable build uinit test for esp32-s3
2020-09-22 15:15:03 +08:00
test_spi_bus_lock.c
global: enable build uinit test for esp32-s3
2020-09-22 15:15:03 +08:00
test_spi_master.c
tests: re-add all disabled tests and all disabled configurations
2020-10-14 16:11:49 +11:00
test_spi_param.c
global: enable build uinit test for esp32-s3
2020-09-22 15:15:03 +08:00
test_spi_sio.c
global: enable build uinit test for esp32-s3
2020-09-22 15:15:03 +08:00
test_spi_slave_hd.c
global: enable build uinit test for esp32-s3
2020-09-22 15:15:03 +08:00
test_spi_slave.c
global: enable build uinit test for esp32-s3
2020-09-22 15:15:03 +08:00
test_timer.c
global: enable build uinit test for esp32-s3
2020-09-22 15:15:03 +08:00
test_uart.c
driver: add diagnostic information into UART test, enable flow control
2020-10-02 17:33:35 +02:00