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esp-idf/components/usb/test_apps/hcd/main
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Darian Leung 7f61f74aa0
refactor(usb): Split test device descriptors from mock class files 
Previously, descriptors of the test devices were stored direclty in the mock
device files (e.g., "mock_[hid|msc].[h|c]"). This commit splits out the device
descriptors to separate files (e.g., "dev_[hid|msc].c") along with getter
functions.

Users that want to run the tests locally on a different device simply need to
update the "dev_[hid|msc].c" file for their device.
2024-06-09 10:43:25 +08:00
..
CMakeLists.txt fix(usb/host): Sync cache for memory shared by CPU and USB-OTG 2024-01-10 15:23:24 +01:00
test_app_main.c refactor(usb): Split test device descriptors from mock class files 2024-06-09 10:43:25 +08:00
test_hcd_bulk.c refactor(usb): Split test device descriptors from mock class files 2024-06-09 10:43:25 +08:00
test_hcd_common.c refactor(usb): Split test device descriptors from mock class files 2024-06-09 10:43:25 +08:00
test_hcd_common.h ci: Added esp32p4 usb tests to CI: 2024-02-29 10:35:09 +01:00
test_hcd_ctrl.c refactor(usb): Rename mock class files 2024-06-09 10:43:20 +08:00
test_hcd_intr.c refactor(usb): Split test device descriptors from mock class files 2024-06-09 10:43:25 +08:00
test_hcd_isoc.c refactor(usb): Split test device descriptors from mock class files 2024-06-09 10:43:25 +08:00
test_hcd_port.c refactor(usb): Rename mock class files 2024-06-09 10:43:20 +08:00
test_usb_helpers.c refactor(usb): Rename mock class files 2024-06-09 10:43:20 +08:00