esp-idf/components/hal/linker.lf
songruojing 8d84033b8c gpio: Clean up unit tests and enable ci ut on some previously disabled test cases
Eliminate UT_T1_GPIO runner requirement by routing internally through gpio matrix and by setting gpio pins to GPIO_MODE_INPUT_OUTPUT mode for all interrupt related test cases.
2022-03-30 15:11:08 +08:00

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[mapping:hal]
archive: libhal.a
entries:
mmu_hal (noflash)
if IDF_TARGET_ESP32 = n:
cache_hal (noflash)
spi_hal_iram (noflash)
spi_slave_hal_iram (noflash)
if UART_ISR_IN_IRAM = y || ESP_PANIC_HANDLER_IRAM = y:
uart_hal_iram (noflash)
else:
uart_hal_iram (default)
spi_flash_hal_iram (noflash)
spi_flash_encrypt_hal_iram (noflash)
ledc_hal_iram (noflash)
i2c_hal_iram (noflash)
cpu_hal (noflash)
soc_hal (noflash)
wdt_hal_iram (noflash)
if TWAI_ISR_IN_IRAM = y:
twai_hal_iram (noflash)
if IDF_TARGET_ESP32 = n:
spi_flash_hal_gpspi (noflash)
systimer_hal (noflash)
if GPTIMER_CTRL_FUNC_IN_IRAM = y:
timer_hal_iram (noflash)
if GPIO_CTRL_FUNC_IN_IRAM = y:
gpio_hal: gpio_hal_intr_disable (noflash)