alex/esp-idf
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esp-idf/components/fatfs/test_apps/sdcard
History
Adam Múdry 381d0fe032 sdmmc: add vTaskDelay to loops to prevent potential WDT trigger 
Also change timeout to 120 seconds in fatfs sdcard pytest to prevent failing during formatting.
2023-04-11 11:06:56 +00:00
..
main sdspi: h2 support 2023-02-27 14:39:06 +08:00
CMakeLists.txt fatfs: migrate unit tests to component test app, re-enable test for C2 2022-10-04 17:39:38 +02:00
partitions.csv fatfs: migrate unit tests to component test app, re-enable test for C2 2022-10-04 17:39:38 +02:00
pytest_fatfs_sdcard.py sdmmc: add vTaskDelay to loops to prevent potential WDT trigger 2023-04-11 11:06:56 +00:00
README.md sdspi: h2 support 2023-02-27 14:39:06 +08:00
sdkconfig.ci.default fatfs: migrate unit tests to component test app, re-enable test for C2 2022-10-04 17:39:38 +02:00
sdkconfig.ci.psram fatfs: migrate unit tests to component test app, re-enable test for C2 2022-10-04 17:39:38 +02:00
sdkconfig.ci.release fatfs: migrate unit tests to component test app, re-enable test for C2 2022-10-04 17:39:38 +02:00
sdkconfig.defaults fatfs: migrate unit tests to component test app, re-enable test for C2 2022-10-04 17:39:38 +02:00

README.md

Supported Targets ESP32 ESP32-C2 ESP32-C3 ESP32-C6 ESP32-H2 ESP32-S2 ESP32-S3

This test app runs a few FATFS test cases in a FAT-formatted SD card.

These tests require a development board with an SD card slot:

  • ESP32-WROVER-KIT
  • ESP32-S2 USB_OTG
  • ESP32-C3-DevKit-C with an SD card breakout board

The test cases are split between [sdmmc] and [sdspi]. Only a few tests are executed for sdspi, though. The app could be refactored to ensure that a similar set of tests runs for sdmmc and sdspi.

See ../README.md for more information about FATFS test apps.