esp-idf/components/idf_test/include
Sudeep Mohanty 459ff8348f fix(riscv): Added RISC-V functions to set interrupt threshold for CLIC targets
This commit added the RISC-V utility functions to set the interrupt
threshold for CLIC targets by using direct register value writes.
This makes the functions more efficient during run-time.
This is done to improve the critical section enter and exit performance on esp32p4.
2024-02-28 08:51:37 +01:00
..
esp32 feat(sdio): sdio cross chip test app 2023-11-13 11:21:47 +08:00
esp32c2 refactor(spi_master): replace dma_ll in spi hal layer (part 2.1) 2023-12-28 19:58:54 +08:00
esp32c3 spi: add high freq test on different spi config 2023-02-27 11:27:57 +08:00
esp32c5 feat(esp32c5): introduce target esp32c5 2023-11-28 16:14:17 +08:00
esp32c6 feat(sdio): sdio cross chip test app 2023-11-13 11:21:47 +08:00
esp32h2 feat(esp_timer): Re-enable tests on ESP32P4 2024-01-30 13:39:23 +02:00
esp32p4 fix(riscv): Added RISC-V functions to set interrupt threshold for CLIC targets 2024-02-28 08:51:37 +01:00
esp32s2 spi: add high freq test on different spi config 2023-02-27 11:27:57 +08:00
esp32s3 spi: add high freq test on different spi config 2023-02-27 11:27:57 +08:00
idf_performance.h feat(sdio): sdio cross chip test app 2023-11-13 11:21:47 +08:00