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esp-idf/components/fatfs/test_apps/flash_wl
History
Adam Múdry fa16ed3898 CI: sdcard tests fail fix
2023-05-10 16:48:03 +02:00
..
main CI: sdcard tests fail fix 2023-05-10 16:48:03 +02:00
CMakeLists.txt fatfs: migrate unit tests to component test app, re-enable test for C2 2022-10-04 17:39:38 +02:00
partitions.csv fatfs: migrate unit tests to component test app, re-enable test for C2 2022-10-04 17:39:38 +02:00
pytest_fatfs_flash_wl.py CI: sdcard tests fail fix 2023-05-10 16:48:03 +02:00
README.md esp32h2: add build test 2023-01-17 10:29:04 +08:00
sdkconfig.ci.default fatfs: migrate unit tests to component test app, re-enable test for C2 2022-10-04 17:39:38 +02:00
sdkconfig.ci.fastseek fatfs: migrate unit tests to component test app, re-enable test for C2 2022-10-04 17:39:38 +02:00
sdkconfig.ci.psram fatfs: migrate unit tests to component test app, re-enable test for C2 2022-10-04 17:39:38 +02:00
sdkconfig.ci.release fatfs: migrate unit tests to component test app, re-enable test for C2 2022-10-04 17:39:38 +02:00
sdkconfig.defaults fatfs: migrate unit tests to component test app, re-enable test for C2 2022-10-04 17:39:38 +02:00

README.md

Supported Targets ESP32 ESP32-C2 ESP32-C3 ESP32-C6 ESP32-H2 ESP32-S2 ESP32-S3

This test app runs a few FATFS test cases in a wear levelling FAT partition.

These tests should be possible to run on any ESP development board, not extra hardware is necessary.

See ../README.md for more information about FATFS test apps.