esp-idf/components/fatfs/test_apps/flash_wl
2023-10-02 07:06:05 +02:00
..
main feat(vfs/fatfs): Add option for automatic immediate fsync 2023-10-02 07:06:05 +02:00
CMakeLists.txt fatfs: migrate unit tests to component test app, re-enable test for C2 2022-10-04 17:39:38 +02:00
partitions.csv fatfs: migrate unit tests to component test app, re-enable test for C2 2022-10-04 17:39:38 +02:00
pytest_fatfs_flash_wl.py CI: sdcard tests fail fix 2023-05-10 16:48:03 +02:00
README.md feat(ci): Enable p4 example, test_apps and unit tests CI build 2023-08-24 12:51:19 +08:00
sdkconfig.ci.auto_fsync feat(vfs/fatfs): Add option for automatic immediate fsync 2023-10-02 07:06:05 +02:00
sdkconfig.ci.default fatfs: migrate unit tests to component test app, re-enable test for C2 2022-10-04 17:39:38 +02:00
sdkconfig.ci.fastseek fatfs: migrate unit tests to component test app, re-enable test for C2 2022-10-04 17:39:38 +02:00
sdkconfig.ci.psram fatfs: migrate unit tests to component test app, re-enable test for C2 2022-10-04 17:39:38 +02:00
sdkconfig.ci.release fatfs: migrate unit tests to component test app, re-enable test for C2 2022-10-04 17:39:38 +02:00
sdkconfig.defaults fatfs: migrate unit tests to component test app, re-enable test for C2 2022-10-04 17:39:38 +02:00

Supported Targets ESP32 ESP32-C2 ESP32-C3 ESP32-C6 ESP32-H2 ESP32-P4 ESP32-S2 ESP32-S3

This test app runs a few FATFS test cases in a wear levelling FAT partition.

These tests should be possible to run on any ESP development board, not extra hardware is necessary.

See ../README.md for more information about FATFS test apps.