esp-idf/components/spi_flash/test
Angus Gratton 11d2db40f4 spi_flash: Fix SPI flash write alignment/size bugs
* Writing >4 bytes to unaligned offsets would fail
* Writiing data from flash would fail (wrong buffer was used)
* Writing >8192 bytes from RAM would over-write data multiple times

Adds test cases for the above.
2017-06-09 17:33:27 +10:00
..
component.mk add unit tests to esp-idf 2016-11-22 14:45:50 +08:00
test_cache_disabled.c add test case for invalid cache access interrupt 2017-04-13 15:27:39 +08:00
test_flash_encryption.c unit tests: Use a unit test app partition table, configure spi_flash to use data partition 2017-02-22 10:26:04 +11:00
test_large_flash_writes.c spi_flash: Fix SPI flash write alignment/size bugs 2017-06-09 17:33:27 +10:00
test_mmap.c spi_flash: fix stale data being read from mmaped region 2017-03-04 17:48:44 +08:00
test_partitions.c spi_flash: Fixed bug in SPI flash ROM driver to work with embedded flash chip 2017-04-11 10:51:19 +08:00
test_read_write.c spi_flash: Fixed bug in SPI flash ROM driver to work with embedded flash chip 2017-04-11 10:51:19 +08:00
test_spi_flash.c spi_flash: fix race condition in s_flash_op_complete access 2017-03-28 01:34:17 +08:00