Ivan Grokhotkov 2c3644a09f nvs: don’t expect items with bad CRC to be in cache ...

When erasing a variable length item with an incorrect CRC32, the span
value of the item can not be trusted, so the item will be erased with
span = 1. Subsequent entries represent the data of the variable
length item, and these will be treated as separate items. For each
entry CRC32 is checked, the check most likely fails (because the
entry contains arbitrary data, and not a proper NVS item), and the
entry is erased. Erase function assumed that every item should be
present in cache, but it is not the case for the entries which are
just parts of item’s payload. This change allows for the item to be
not found in the hashlist, if the CRC32 check fails.

2018-04-16 09:36:17 +00:00

..

crc.cpp

add unit tests to esp-idf

2016-11-22 14:45:50 +08:00

crc.h

add unit tests to esp-idf

2016-11-22 14:45:50 +08:00

esp_error_check_stub.cpp

esp_err: Use separate code path for ESP_ERROR_CHECK assertion

2017-03-03 15:33:23 +11:00

main.cpp

add unit tests to esp-idf

2016-11-22 14:45:50 +08:00

Makefile

move Catch framework header into tools directory

2017-04-17 11:01:18 +08:00

sdkconfig.h

add unit tests to esp-idf

2016-11-22 14:45:50 +08:00

spi_flash_emulation.cpp

add unit tests to esp-idf

2016-11-22 14:45:50 +08:00

spi_flash_emulation.h

nvs_flash: emulator: fix issues in load function, add save function

2017-09-19 10:39:44 +08:00

test_compressed_enum_table.cpp

add unit tests to esp-idf

2016-11-22 14:45:50 +08:00

test_intrusive_list.cpp

add unit tests to esp-idf

2016-11-22 14:45:50 +08:00

test_nvs.cpp

nvs: don’t expect items with bad CRC to be in cache

2018-04-16 09:36:17 +00:00

test_spi_flash_emulation.cpp

add unit tests to esp-idf

2016-11-22 14:45:50 +08:00