alex/esp-idf
alex/esp-idf
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esp-idf/components/driver/test
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Sachin Parekh e6a714480d unit-test-app: freertos_compliance config added 
Signed-off-by: Sachin Parekh <sachin.parekh@espressif.com>
2019-05-13 16:39:19 +05:30
..
include/test
spi: add new test for timing and mode
2019-01-26 00:10:41 +08:00
param_test
test: add new test framework for different configurations
2019-01-26 00:10:41 +08:00
CMakeLists.txt
test: add new test framework for different configurations
2019-01-26 00:10:41 +08:00
component.mk
test: add new test framework for different configurations
2019-01-26 00:10:41 +08:00
test_adc2.c
unit tests: Only initialise tcpip_adapter() when needed by the test
2018-10-17 22:53:46 +00:00
test_common_spi.c
global: move the soc component out of the common list
2019-04-16 13:21:15 +08:00
test_gpio.c
separate rom from esp32 component to esp_rom
2019-03-21 18:51:45 +08:00
test_i2c.c
test: Fix some unused identifier warnings
2018-12-10 12:34:16 +08:00
test_i2s.c
test: components/driver: i2s case
2018-11-29 11:32:40 +08:00
test_ledc.c
separate rom from esp32 component to esp_rom
2019-03-21 18:51:45 +08:00
test_pcnt.c
separate rom from esp32 component to esp_rom
2019-03-21 18:51:45 +08:00
test_pwm.c
separate rom from esp32 component to esp_rom
2019-03-21 18:51:45 +08:00
test_rmt.c
rmt test: add the case for bug in github[#1815]
2018-09-06 19:43:30 +08:00
test_sdmmc_sdspi_init.cpp
sdmmc, sdspi: fix initializers to be C++-compatible, add test
2018-04-23 14:35:13 +08:00
test_sigmadelta.c
test: driver/sigmadelta test case
2018-06-13 10:15:06 +08:00
test_spi_master.c
unit-test-app: freertos_compliance config added
2019-05-13 16:39:19 +05:30
test_spi_param.c
Merge branch 'test/spi_sio_test' into 'master'
2019-03-13 15:15:43 +08:00
test_spi_sio.c
separate rom from esp32 component to esp_rom
2019-03-21 18:51:45 +08:00
test_spi_slave.c
global: move the soc component out of the common list
2019-04-16 13:21:15 +08:00
test_timer.c
test: components/driver: timer case
2018-06-13 01:39:07 +00:00
test_uart.c
test: clean up "leaks" tags from most unit tests
2019-04-16 20:07:40 +08:00