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components
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feat(sdio): sdio cross chip test app
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2023-11-13 11:21:47 +08:00 |
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dac_test_apps/legacy_dac_driver
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refactor(dac): make dac driver as component
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2023-11-23 12:04:06 +08:00 |
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i2s_test_apps
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refactor(i2s): make i2s driver as component
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2023-11-17 21:29:17 +08:00 |
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legacy_adc_driver
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fix(adc): rename ADC_ATTEN_DB_11 to ADC_ATTEN_DB_12
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2023-11-06 18:55:49 +08:00 |
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legacy_i2c_driver
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fix(i2c): test app change gpio
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2024-01-11 21:44:30 +08:00 |
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legacy_mcpwm_driver
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fix(mcpwm): enable mcpwm group clock before hal init
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2024-01-15 18:13:56 +08:00 |
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legacy_pcnt_driver
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change(pcnt): reenable the target test for esp32p4
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2024-01-10 23:03:40 +08:00 |
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legacy_rmt_driver
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ci(p4): enable esp32p4 target test
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2024-01-04 09:34:55 +08:00 |
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legacy_rtc_temp_driver
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ci(p4): enable esp32p4 target test
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2024-01-04 09:34:55 +08:00 |
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legacy_sigma_delta_driver
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ci(p4): enable esp32p4 target test
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2024-01-04 09:34:55 +08:00 |
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legacy_timer_driver
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ci(p4): added todo jira for disabled tests on p4
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2024-01-04 09:36:38 +08:00 |
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touch_sensor_v1
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driver:Trim the build components
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2023-06-13 14:24:44 +08:00 |
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touch_sensor_v2
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fix(uart,usj...): Fix wrong serial number that has been parsed to rom functions,
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2024-01-18 10:51:51 +08:00 |
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twai
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fix(twai): enable twai interactive test for all targets on new std runner
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2024-01-05 15:22:09 +08:00 |
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.build-test-rules.yml
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fix(mcpwm): enable mcpwm group clock before hal init
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2024-01-15 18:13:56 +08:00 |
