esp-idf/components/spi_flash/test/test_spi_flash.c
Marius Vikhammer 0a95151a75 unit_test: Refactor all performance tests that rely on cache compensated timer
There is no ccomp timer on C3, which means our performance tests will start
failing again due to variance caused by cache misses.

This MR adds TEST_PERFORMANCE_CCOMP_ macro that will only fail
performance test if CCOMP timer is supported on the target
2020-12-22 18:56:24 +11:00

422 lines
13 KiB
C

#include <stdio.h>
#include <sys/param.h>
#include <freertos/FreeRTOS.h>
#include <freertos/task.h>
#include <freertos/semphr.h>
#include <unity.h>
#include <esp_spi_flash.h>
#include <esp_attr.h>
#include "driver/timer.h"
#include "esp_intr_alloc.h"
#include "test_utils.h"
#include "ccomp_timer.h"
#include "esp_log.h"
#include "esp_rom_sys.h"
#include "esp_timer.h"
#include "sdkconfig.h"
#if CONFIG_IDF_TARGET_ESP32
#include "esp32/rom/spi_flash.h"
#elif CONFIG_IDF_TARGET_ESP32S2
#include "esp32s2/rom/spi_flash.h"
#elif CONFIG_IDF_TARGET_ESP32S3
#include "esp32s3/rom/spi_flash.h"
#elif CONFIG_IDF_TARGET_ESP32C3
#include "esp32c3/rom/spi_flash.h"
#endif
struct flash_test_ctx {
uint32_t offset;
bool fail;
SemaphoreHandle_t done;
};
static const char TAG[] = "test_spi_flash";
/* Base offset in flash for tests. */
static size_t start;
static void setup_tests(void)
{
if (start == 0) {
const esp_partition_t *part = get_test_data_partition();
start = part->address;
printf("Test data partition @ 0x%x\n", start);
}
}
static void flash_test_task(void *arg)
{
struct flash_test_ctx *ctx = (struct flash_test_ctx *) arg;
vTaskDelay(100 / portTICK_PERIOD_MS);
const uint32_t sector = start / SPI_FLASH_SEC_SIZE + ctx->offset;
printf("t%d\n", sector);
printf("es%d\n", sector);
if (spi_flash_erase_sector(sector) != ESP_OK) {
ctx->fail = true;
printf("Erase failed\r\n");
xSemaphoreGive(ctx->done);
vTaskDelete(NULL);
}
printf("ed%d\n", sector);
vTaskDelay(0 / portTICK_PERIOD_MS);
uint32_t val = 0xabcd1234;
for (uint32_t offset = 0; offset < SPI_FLASH_SEC_SIZE; offset += 4) {
if (spi_flash_write(sector * SPI_FLASH_SEC_SIZE + offset, (const uint8_t *) &val, 4) != ESP_OK) {
printf("Write failed at offset=%d\r\n", offset);
ctx->fail = true;
break;
}
}
printf("wd%d\n", sector);
vTaskDelay(0 / portTICK_PERIOD_MS);
uint32_t val_read;
for (uint32_t offset = 0; offset < SPI_FLASH_SEC_SIZE; offset += 4) {
if (spi_flash_read(sector * SPI_FLASH_SEC_SIZE + offset, (uint8_t *) &val_read, 4) != ESP_OK) {
printf("Read failed at offset=%d\r\n", offset);
ctx->fail = true;
break;
}
if (val_read != val) {
printf("Read invalid value=%08x at offset=%d\r\n", val_read, offset);
ctx->fail = true;
break;
}
}
printf("td%d\n", sector);
xSemaphoreGive(ctx->done);
vTaskDelete(NULL);
}
TEST_CASE("flash write and erase work both on PRO CPU and on APP CPU", "[spi_flash][ignore]")
{
setup_tests();
SemaphoreHandle_t done = xSemaphoreCreateCounting(4, 0);
struct flash_test_ctx ctx[] = {
{ .offset = 0x10 + 6, .done = done },
{ .offset = 0x10 + 7, .done = done },
{ .offset = 0x10 + 8, .done = done },
#ifndef CONFIG_FREERTOS_UNICORE
{ .offset = 0x10 + 9, .done = done }
#endif
};
xTaskCreatePinnedToCore(flash_test_task, "t0", 2048, &ctx[0], 3, NULL, 0);
xTaskCreatePinnedToCore(flash_test_task, "t1", 2048, &ctx[1], 3, NULL, tskNO_AFFINITY);
xTaskCreatePinnedToCore(flash_test_task, "t2", 2048, &ctx[2], 3, NULL, tskNO_AFFINITY);
#ifndef CONFIG_FREERTOS_UNICORE
xTaskCreatePinnedToCore(flash_test_task, "t3", 2048, &ctx[3], 3, NULL, 1);
#endif
const size_t task_count = sizeof(ctx)/sizeof(ctx[0]);
for (int i = 0; i < task_count; ++i) {
xSemaphoreTake(done, portMAX_DELAY);
TEST_ASSERT_FALSE(ctx[i].fail);
}
vSemaphoreDelete(done);
}
typedef struct {
size_t buf_size;
uint8_t* buf;
size_t flash_addr;
size_t repeat_count;
SemaphoreHandle_t done;
} read_task_arg_t;
typedef struct {
size_t delay_time_us;
size_t repeat_count;
} block_task_arg_t;
#ifdef CONFIG_IDF_TARGET_ESP32S2
#define int_clr_timers int_clr
#endif
static void IRAM_ATTR timer_isr(void* varg) {
block_task_arg_t* arg = (block_task_arg_t*) varg;
timer_group_clr_intr_status_in_isr(TIMER_GROUP_0, TIMER_0);
timer_group_enable_alarm_in_isr(TIMER_GROUP_0, TIMER_0);
esp_rom_delay_us(arg->delay_time_us);
arg->repeat_count++;
}
static void read_task(void* varg) {
read_task_arg_t* arg = (read_task_arg_t*) varg;
for (size_t i = 0; i < arg->repeat_count; ++i) {
ESP_ERROR_CHECK( spi_flash_read(arg->flash_addr, arg->buf, arg->buf_size) );
}
xSemaphoreGive(arg->done);
vTaskDelay(1);
vTaskDelete(NULL);
}
TEST_CASE("spi flash functions can run along with IRAM interrupts", "[spi_flash][esp_flash]")
{
const size_t size = 128;
read_task_arg_t read_arg = {
.buf_size = size,
.buf = (uint8_t*) malloc(size),
.flash_addr = 0,
.repeat_count = 1000,
.done = xSemaphoreCreateBinary()
};
timer_config_t config = {
.alarm_en = true,
.counter_en = false,
.intr_type = TIMER_INTR_LEVEL,
.counter_dir = TIMER_COUNT_UP,
.auto_reload = true,
.divider = 80
};
block_task_arg_t block_arg = {
.repeat_count = 0,
.delay_time_us = 100
};
ESP_ERROR_CHECK( timer_init(TIMER_GROUP_0, TIMER_0, &config) );
timer_pause(TIMER_GROUP_0, TIMER_0);
ESP_ERROR_CHECK( timer_set_alarm_value(TIMER_GROUP_0, TIMER_0, 120) );
intr_handle_t handle;
ESP_ERROR_CHECK( timer_isr_register(TIMER_GROUP_0, TIMER_0, &timer_isr, &block_arg, ESP_INTR_FLAG_IRAM, &handle) );
timer_set_counter_value(TIMER_GROUP_0, TIMER_0, 0);
timer_enable_intr(TIMER_GROUP_0, TIMER_0);
timer_start(TIMER_GROUP_0, TIMER_0);
xTaskCreatePinnedToCore(read_task, "r", 2048, &read_arg, 3, NULL, portNUM_PROCESSORS - 1);
xSemaphoreTake(read_arg.done, portMAX_DELAY);
timer_pause(TIMER_GROUP_0, TIMER_0);
timer_disable_intr(TIMER_GROUP_0, TIMER_0);
esp_intr_free(handle);
vSemaphoreDelete(read_arg.done);
free(read_arg.buf);
}
typedef struct {
uint32_t us_start;
size_t len;
const char* name;
} time_meas_ctx_t;
static void time_measure_start(time_meas_ctx_t* ctx)
{
ctx->us_start = esp_timer_get_time();
ccomp_timer_start();
}
static uint32_t time_measure_end(time_meas_ctx_t* ctx)
{
uint32_t c_time_us = ccomp_timer_stop();
uint32_t time_us = esp_timer_get_time() - ctx->us_start;
ESP_LOGI(TAG, "%s: compensated: %.2lf kB/s, typical: %.2lf kB/s", ctx->name, ctx->len / (c_time_us/1000.), ctx->len / (time_us/1000.));
return ctx->len * 1000 / (c_time_us / 1000);
}
#define TEST_TIMES 20
#define TEST_SECTORS 4
static uint32_t measure_erase(const esp_partition_t* part)
{
const int total_len = SPI_FLASH_SEC_SIZE * TEST_SECTORS;
time_meas_ctx_t time_ctx = {.name = "erase", .len = total_len};
time_measure_start(&time_ctx);
esp_err_t err = spi_flash_erase_range(part->address, total_len);
TEST_ESP_OK(err);
return time_measure_end(&time_ctx);
}
// should called after measure_erase
static uint32_t measure_write(const char* name, const esp_partition_t* part, const uint8_t* data_to_write, int seg_len)
{
const int total_len = SPI_FLASH_SEC_SIZE;
time_meas_ctx_t time_ctx = {.name = name, .len = total_len * TEST_TIMES};
time_measure_start(&time_ctx);
for (int i = 0; i < TEST_TIMES; i ++) {
// Erase one time, but write 100 times the same data
size_t len = total_len;
int offset = 0;
while (len) {
int len_write = MIN(seg_len, len);
esp_err_t err = spi_flash_write(part->address + offset, data_to_write + offset, len_write);
TEST_ESP_OK(err);
offset += len_write;
len -= len_write;
}
}
return time_measure_end(&time_ctx);
}
static uint32_t measure_read(const char* name, const esp_partition_t* part, uint8_t* data_read, int seg_len)
{
const int total_len = SPI_FLASH_SEC_SIZE;
time_meas_ctx_t time_ctx = {.name = name, .len = total_len * TEST_TIMES};
time_measure_start(&time_ctx);
for (int i = 0; i < TEST_TIMES; i ++) {
size_t len = total_len;
int offset = 0;
while (len) {
int len_read = MIN(seg_len, len);
esp_err_t err = spi_flash_read(part->address + offset, data_read + offset, len_read);
TEST_ESP_OK(err);
offset += len_read;
len -= len_read;
}
}
return time_measure_end(&time_ctx);
}
#define MEAS_WRITE(n) (measure_write("write in "#n"-byte chunks", part, data_to_write, n))
#define MEAS_READ(n) (measure_read("read in "#n"-byte chunks", part, data_read, n))
TEST_CASE("Test spi_flash read/write performance", "[spi_flash]")
{
const esp_partition_t *part = get_test_data_partition();
const int total_len = SPI_FLASH_SEC_SIZE;
uint8_t *data_to_write = heap_caps_malloc(total_len, MALLOC_CAP_INTERNAL | MALLOC_CAP_8BIT);
uint8_t *data_read = heap_caps_malloc(total_len, MALLOC_CAP_INTERNAL | MALLOC_CAP_8BIT);
srand(777);
for (int i = 0; i < total_len; i++) {
data_to_write[i] = rand();
}
uint32_t erase_1 = measure_erase(part);
uint32_t speed_WR_4B = MEAS_WRITE(4);
uint32_t speed_RD_4B = MEAS_READ(4);
uint32_t erase_2 = measure_erase(part);
uint32_t speed_WR_2KB = MEAS_WRITE(2048);
uint32_t speed_RD_2KB = MEAS_READ(2048);
TEST_ASSERT_EQUAL_HEX8_ARRAY(data_to_write, data_read, total_len);
// Data checks are disabled when PSRAM is used or in Freertos compliance check test
#if !CONFIG_SPIRAM && !CONFIG_FREERTOS_CHECK_PORT_CRITICAL_COMPLIANCE
# define CHECK_DATA(suffix) TEST_PERFORMANCE_CCOMP_GREATER_THAN(FLASH_SPEED_BYTE_PER_SEC_LEGACY_##suffix, "%d", speed_##suffix)
# define CHECK_ERASE(var) TEST_PERFORMANCE_CCOMP_GREATER_THAN(FLASH_SPEED_BYTE_PER_SEC_LEGACY_ERASE, "%d", var)
#else
# define CHECK_DATA(suffix) ((void)speed_##suffix)
# define CHECK_ERASE(var) ((void)var)
#endif
CHECK_DATA(WR_4B);
CHECK_DATA(RD_4B);
CHECK_DATA(WR_2KB);
CHECK_DATA(RD_2KB);
// Erase time may vary a lot, can increase threshold if this fails with a reasonable speed
CHECK_ERASE(erase_1);
CHECK_ERASE(erase_2);
free(data_to_write);
free(data_read);
}
#if portNUM_PROCESSORS > 1
TEST_CASE("spi_flash deadlock with high priority busy-waiting task", "[spi_flash][esp_flash]")
{
typedef struct {
QueueHandle_t queue;
volatile bool done;
} deadlock_test_arg_t;
/* Create two tasks: high-priority consumer on CPU0, low-priority producer on CPU1.
* Consumer polls the queue until it gets some data, then yields.
* Run flash operation on CPU0. Check that when IPC1 task blocks out the producer,
* the task which does flash operation does not get blocked by the consumer.
*/
void producer_task(void* varg)
{
int dummy = 0;
deadlock_test_arg_t* arg = (deadlock_test_arg_t*) varg;
while (!arg->done) {
xQueueSend(arg->queue, &dummy, 0);
vTaskDelay(1);
}
vTaskDelete(NULL);
}
void consumer_task(void* varg)
{
int dummy;
deadlock_test_arg_t* arg = (deadlock_test_arg_t*) varg;
while (!arg->done) {
if (xQueueReceive(arg->queue, &dummy, 0) == pdTRUE) {
vTaskDelay(1);
}
}
vTaskDelete(NULL);
}
deadlock_test_arg_t arg = {
.queue = xQueueCreate(32, sizeof(int)),
.done = false
};
TEST_ASSERT(xTaskCreatePinnedToCore(&producer_task, "producer", 4096, &arg, 5, NULL, 1));
TEST_ASSERT(xTaskCreatePinnedToCore(&consumer_task, "consumer", 4096, &arg, 10, NULL, 0));
for (int i = 0; i < 1000; i++) {
uint32_t dummy;
TEST_ESP_OK(spi_flash_read(0, &dummy, sizeof(dummy)));
}
arg.done = true;
vTaskDelay(5);
vQueueDelete(arg.queue);
/* Check that current task priority is still correct */
TEST_ASSERT_EQUAL_INT(uxTaskPriorityGet(NULL), UNITY_FREERTOS_PRIORITY);
}
#endif // portNUM_PROCESSORS > 1
TEST_CASE("WEL is cleared after boot", "[spi_flash]")
{
esp_rom_spiflash_chip_t *legacy_chip = &g_rom_flashchip;
uint32_t status;
esp_rom_spiflash_read_status(legacy_chip, &status);
TEST_ASSERT((status & 0x2) == 0);
}
#if CONFIG_ESPTOOLPY_FLASHMODE_QIO
// ISSI chip has its QE bit on other chips' BP4, which may get cleared by accident
TEST_CASE("rom unlock will not erase QE bit", "[spi_flash]")
{
esp_rom_spiflash_chip_t *legacy_chip = &g_rom_flashchip;
uint32_t status;
printf("dev_id: %08X \n", legacy_chip->device_id);
if (((legacy_chip->device_id >> 16) & 0xff) != 0x9D) {
TEST_IGNORE_MESSAGE("This test is only for ISSI chips. Ignore.");
}
esp_rom_spiflash_unlock();
esp_rom_spiflash_read_status(legacy_chip, &status);
printf("status: %08x\n", status);
TEST_ASSERT(status & 0x40);
}
#endif