Adam Múdry 4a6cc1d2a4 vfs/fatfs: fix failed tests by increasing timeout ...

Default 30s timeout is too low for a case when SD card formatting is triggered,
which could lead to tests failure. Timeout of tests is now set to 60s.

JIRA IDFCI-742

2021-08-25 19:04:34 +08:00

..

CMakeLists.txt

Whitespace: Automated whitespace fixes (large commit)

2020-11-11 07:36:35 +00:00

component.mk

ut: Move tests back from "esp32" subfolder

2020-01-06 17:13:53 +08:00

fatfs.img

FATFS support without wear levelling

2018-06-16 16:02:35 +08:00

test_fatfs_common.c

fatfs: return EINVAL if truncate length is less than 0

2021-01-13 19:11:48 +08:00

test_fatfs_common.h

Whitespace: Automated whitespace fixes (large commit)

2020-11-11 07:36:35 +00:00

test_fatfs_rawflash.c

esp_rom: extract common ets apis into esp_rom_sys.h

2020-07-27 15:27:01 +08:00

test_fatfs_sdmmc.c

vfs/fatfs: fix failed tests by increasing timeout

2021-08-25 19:04:34 +08:00

test_fatfs_spiflash.c

fatfs: fix SPIRAM allocation not used due to Kconfig option name error

2020-09-14 18:30:31 +02:00