esp-idf/components/driver/test_apps
2023-04-21 18:57:06 +08:00
..
analog_comparator ana_cmpr: add programming guide 2023-03-17 14:35:55 +08:00
components spi_slave: add multi board test case for spi slave hd append mode 2023-03-21 11:30:17 +08:00
dac_test_apps ci: update test apps to use run_all_single_board_cases 2023-03-10 14:27:09 +08:00
gpio gpio: Re-enable gpio usb pins test cases on esp32h2 2023-03-09 17:21:43 +08:00
gpio_extensions gptimer: fix race condition between start and stop 2023-03-10 23:27:29 +08:00
gptimer ci: update test apps to use run_all_single_board_cases 2023-03-10 14:27:09 +08:00
i2s_test_apps i2s: workaround for inacurate PLL frequency after switching 2023-04-17 03:15:55 +00:00
ledc ledc: Fix two bugs inside LEDC driver 2023-04-06 12:37:33 +08:00
legacy_adc_driver ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
legacy_mcpwm_driver ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
legacy_pcnt_driver ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
legacy_rmt_driver ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
legacy_rtc_temp_driver TWDT: Use the new TWDT Kconfig options in the examples and tests 2023-02-17 11:22:25 +08:00
legacy_timer_driver ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
mcpwm ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
parlio ci: update test apps to use run_all_single_board_cases 2023-03-10 14:27:09 +08:00
pulse_cnt ci: update test apps to use run_all_single_board_cases 2023-03-10 14:27:09 +08:00
rmt rmt: define RMT_ENCODING_RESET in rmt_encode_state_t 2023-04-17 14:50:51 +08:00
rs485 esp32h2: add build test 2023-01-17 10:29:04 +08:00
sdio sdio: test_sdio add unity sync signals 2023-04-17 10:51:46 +08:00
spi spi_flash: fix config SPI_FLASH_SHARE_SPI1_BUS dependency 2023-04-21 18:57:06 +08:00
temperature_sensor temperature_sensor: Implement temperature monitor interrupt feature on ESP32H2/ESP32C6 2023-03-03 10:38:40 +08:00
touch_sensor_v1 ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
touch_sensor_v2 ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
twai ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
uart esp32h2: add build test 2023-01-17 10:29:04 +08:00