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337b1df430
Tests for external flash chips used to controlled by macros, one bin for one chip. And tests are done manually. This commit refactored the test so that all 3 chips can all run in single test. |
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CMakeLists.txt | ||
component.mk | ||
test_cache_disabled.c | ||
test_esp_flash.c | ||
test_flash_encryption.c | ||
test_large_flash_writes.c | ||
test_mmap.c | ||
test_out_of_bounds_write.c | ||
test_partition_ext.c | ||
test_partitions.c | ||
test_read_write.c | ||
test_spi_flash.c |