esp-idf/components/esp_system/test/test_system_time.c
2021-10-28 08:00:28 +00:00

37 lines
898 B
C

#include <stdio.h>
#include "unity.h"
#include "esp_private/system_internal.h"
#if CONFIG_IDF_TARGET_ESP32
#include "esp32/clk.h"
#elif CONFIG_IDF_TARGET_ESP32S2
#include "esp32s2/clk.h"
#elif CONFIG_IDF_TARGET_ESP32S3
#include "esp32s3/clk.h"
#elif CONFIG_IDF_TARGET_ESP32C3
#include "esp32c3/clk.h"
#endif
TEST_CASE("Test effect of rtc clk calibration compensation on system time", "[esp_system]")
{
uint32_t prev_cal = esp_clk_slowclk_cal_get();
int64_t t1 = esp_system_get_time();
// Modify calibration value
esp_clk_slowclk_cal_set(prev_cal/2);
// Internally, the origin point of rtc clk has been adjusted
// so that t2 > t1 remains true
int64_t t2 = esp_system_get_time();
TEST_ASSERT_GREATER_THAN(t1, t2);
// Restore calibration value
esp_clk_slowclk_cal_set(prev_cal);
t2 = esp_system_get_time();
TEST_ASSERT_GREATER_THAN(t1, t2);
}