esp-idf/components/driver/test_apps/gpio
Michael (XIAO Xufeng) 3da8120029 Merge branch 'bugfix/gpio_ut_usj_v5.0' into 'release/v5.0'
gpio: add a test case to test the ability of disabling USB D+ pin pull-up (v5.0)

See merge request espressif/esp-idf!22605
2023-03-17 16:34:17 +08:00
..
main gpio: add a test case to test the ability of disabling USB D+ pin pull-up 2023-03-06 11:14:05 +08:00
CMakeLists.txt tools: Increase the minimal supported CMake version to 3.16 2022-06-01 06:35:02 +00:00
pytest_gpio.py test: increase test gpio time timeout 2022-07-14 08:26:01 +08:00
README.md docs: changes docs supported targets tables 2022-07-14 08:26:32 +08:00
sdkconfig.ci.iram_safe gpio: add test with -O0 2022-08-02 23:07:06 +08:00
sdkconfig.ci.release unit test: move gpio, dedicated_gpio, sigmadelta unit test from unit-test-app to components/driver/test_apps/gpio 2022-03-30 15:11:08 +08:00
sdkconfig.defaults TWDT: Use the new TWDT Kconfig options in the examples and tests 2023-03-07 10:23:43 +08:00

Supported Targets ESP32 ESP32-C2 ESP32-C3 ESP32-S2 ESP32-S3