esp-idf/components/driver/test
Angus Gratton 289ad82bc0 driver test: Ensure uart write task can't overflow buffer of read task
Previously both tasks had equal priority, possible for write task and another
internal task to be scheduled at the same time - starving read task and
causing data loss.

Related to IDFCI-59
2020-07-08 16:49:06 +10:00
..
adc_dma_test driver(adc): fix unit test for ADC-DMA (test_esp32s2.c); fix unit test for ADC-DMA (test_esp32s2.c); fix commit in adc dirver. 2020-06-01 15:00:08 +08:00
dac_dma_test driver(I2S): Fix i2s_comm_format_t configuration parameter does not match the TRM bug. 2020-05-18 19:55:30 +08:00
include/test driver(adc): fix unit test for ADC-DMA (test_esp32s2.c); fix unit test for ADC-DMA (test_esp32s2.c); fix commit in adc dirver. 2020-06-01 15:00:08 +08:00
param_test driver: Rename "local" tests to "single board" tests, add some description to the names 2019-12-12 11:05:04 +11:00
touch_sensor_test driver(touch): fix touch sensor denoise unit test case 2020-06-19 22:15:51 +08:00
CMakeLists.txt driver(adc): fix adc io init bug; add unit test to check; 2020-05-12 06:52:26 +00:00
component.mk driver(adc): fix adc io init bug; add unit test to check; 2020-05-12 06:52:26 +00:00
test_adc2_with_wifi.c driver(adc/dac): fix adc dac driver for esp32s2 2020-04-01 12:41:51 +08:00
test_adc_common.c driver(adc): fix unit test for ADC-DMA (test_esp32s2.c); fix unit test for ADC-DMA (test_esp32s2.c); fix commit in adc dirver. 2020-06-01 15:00:08 +08:00
test_common_spi.c spi: re-enable the unit tests for esp32s2beta 2019-12-23 10:22:59 +08:00
test_dac.c driver(adc): add adc initial code before app_main for esp32s2. 2020-04-04 10:15:30 +08:00
test_gpio.c esp_rom: extract common GPIO apis into esp_rom_gpio.h 2020-07-07 11:40:19 +08:00
test_i2c.c esp_rom: extract common GPIO apis into esp_rom_gpio.h 2020-07-07 11:40:19 +08:00
test_i2s.c esp_rom: extract common GPIO apis into esp_rom_gpio.h 2020-07-07 11:40:19 +08:00
test_ledc.c ci: disable case witout runners 2020-02-15 18:28:25 +08:00
test_pcnt.c esp_rom: extract common GPIO apis into esp_rom_gpio.h 2020-07-07 11:40:19 +08:00
test_pwm.c ut: Move tests back from "esp32" subfolder 2020-01-06 17:13:53 +08:00
test_rmt.c esp_rom: extract common GPIO apis into esp_rom_gpio.h 2020-07-07 11:40:19 +08:00
test_rs485.c ci: temporarily disable RS485 related tests 2020-07-06 20:12:43 +00:00
test_rtcio.c rtcio: add hal for driver 2019-11-21 10:40:49 +08:00
test_sdio.c sdio: fix the unit of performance test 2020-05-12 12:25:46 +08:00
test_sdmmc_sdspi_init.cpp sdspi, vfs_fat: allow sharing SPI bus among devices, and mounting multiple SD cards 2020-02-12 15:16:08 +08:00
test_sigmadelta.c test: driver/sigmadelta test case 2018-06-13 10:15:06 +08:00
test_spi_bus_lock.c spi: fix config break and reduce overhead of the bus lock on SPI1 2020-04-22 16:06:13 +08:00
test_spi_master.c spi: allow using esp_flash and spi_master driver on the same bus 2020-03-26 22:08:26 +08:00
test_spi_param.c spi: add unit test for slave receiving length 2020-03-11 13:24:30 +08:00
test_spi_sio.c global: rename esp32s2beta to esp32s2 2020-01-22 12:14:38 +08:00
test_spi_slave.c esp_rom: extract common GPIO apis into esp_rom_gpio.h 2020-07-07 11:40:19 +08:00
test_timer.c bugfix(timer): improve timer unit test case 2020-06-15 16:12:51 +08:00
test_uart.c driver test: Ensure uart write task can't overflow buffer of read task 2020-07-08 16:49:06 +10:00