wanlei
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8625ed252e
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fix(spi): test_apps mv idf_perform_test to esp_driver_spi domain
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2024-03-07 18:16:27 +08:00 |
|
Armando
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faa6e51086
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feat(sdio): sdio cross chip test app
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2023-11-13 11:21:47 +08:00 |
|
gaoxu
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d57c4cde44
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ci(adc): increase adc performance test threshold on c6
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2023-09-28 09:18:58 +00:00 |
|
laokaiyao
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9811ff7be9
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ci(adc): increase all adc performance test threshold on c6
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2023-09-20 11:35:25 +08:00 |
|
laokaiyao
|
f781bf1c5c
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ci(adc): increase adc performance test threshold on c6
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2023-09-18 10:22:11 +08:00 |
|
laokaiyao
|
ffb40a89d9
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adc_cali: supported channel compensation of adc calibration on esp32c6
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2023-05-23 22:44:25 +08:00 |
|
wanlei
|
d8ac58b4d4
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spi: add high freq test on different spi config
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2023-02-27 11:27:57 +08:00 |
|
Armando
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d0e4d36fb6
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esp_adc: support h2 oneshot mode and continuous mode
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2023-02-23 11:48:31 +08:00 |
|
Marius Vikhammer
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f9c1a2b791
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Merge branch 'feature/core_c6_component_tests' into 'master'
ci: update idf-core related tests for C6
Closes IDF-6888
See merge request espressif/esp-idf!22282
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2023-02-14 16:47:52 +08:00 |
|
Armando
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790be9390a
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esp_adc: increase c6 adc std thres
c6, h2, hardware calibration not supported. Reading result varies.
|
2023-02-14 10:18:34 +08:00 |
|
Marius Vikhammer
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25abc7f6d8
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ci: update idf-core related tests for C6
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2023-02-13 13:01:57 +08:00 |
|
Armando
|
3afa671069
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esp_adc: added adc digital filter feature
|
2023-02-10 16:46:20 +00:00 |
|
wanlei
|
b20c156ae6
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spi_master: update spi performance test resulte for C6
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2023-01-18 10:41:43 +08:00 |
|
wanlei
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3aeedc2ad3
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spi: bringup c6 spi master & slave driver support
|
2022-11-18 15:54:14 +08:00 |
|
Sachin Parekh
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69c8df5e49
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esp32c6: Add support for ECC peripheral
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2022-11-07 10:42:33 +05:30 |
|
Song Ruo Jing
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2557e24a28
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ci: Enable esp32c6 example, test_apps, and unit tests CI build stage
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2022-11-01 11:23:21 +08:00 |
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