There is a periodically yield in the esp_flash driver, to ensure the
cache will not be disabled for too long on ESP32.
On ESP32-S2 and later, we need to support more different kind of yield:
1. polling conditions, including timeout, SW read request, etc.
2. wait for events, including HW done/error/auto-suspend, timeout
semaphore, etc.
The check_yield() and yield() is separated into two parts, because we
may need to insert suspend, etc. between them.
Including:
1. Change the write bytes/read bytes parameter in the host driver into slicers to meet the requirements of complicated cases.
2. Refactor the esp_flash_api code a bit so that we can use the code in the ROM laster
3. Provide get_temp_buffer and release_temp_buffer in the os_functions when the buffer passed by application cannot be used directly.
4. Make timeout of operations configurable in the chip_driver.
5. Make dummy number configurable.
There used to be dummy phase before out phase in common command
transactions. This corrupts the data.
The code before never actually operate (clear) the QE bit, once it finds
the QE bit is set. It's hard to check whether the QE set/disable
functions work well.
This commit:
1. Cancel the dummy phase
2. Set and clear the QE bit according to chip settings, allowing tests
for QE bits. However for some chips (Winbond for example), it's not
forced to clear the QE bit if not able to.
3. Also refactor to allow chip_generic and other chips to share the same
code to read and write qe bit; let common command and read command share
configure_host_io_mode.
4. Rename read mode to io mode since maybe we will write data with quad
mode one day.
Add support for get write protection support, fixed the duplicated
set_write_protection link.
All the write_protection check in the top layer are removed. The lower
levels (chip) should ensure to disable write protection before the
operation start.
