Sachin Parekh
b060179400
mbedtls/ecp: Fix incorrect ECP parameter value
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- Add sanity checks in mbedtls port
- Add ECP test cases covering shorter scalar values
2023-01-18 14:24:57 +05:30
Aditya Patwardhan
634e408ca4
Merge branch 'fix/mbedtls_port_sanity_checks_and_return_values' into 'master'
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mbedtls/port: refactor sanity checks and their return values
Closes IDF-3810
See merge request espressif/esp-idf!21987
2023-01-17 19:21:52 +08:00
Cao Sen Miao
94120b82c2
esp32h2: add build test
2023-01-17 10:29:04 +08:00
harshal.patil
5ee1e97e6f
mbedtls: added a test of different auth-tag lengths in AES-GCM
2023-01-16 15:04:08 +05:30
Harshit Malpani
49ce5ada76
ci: Fix ci failures for target esp32c6
2023-01-04 11:20:52 +05:30
LiPeng
5c93fe47cb
mbedtls: GCM implementation is replaced with CTR-based calculation
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- GCM operation in mbedtls used ECB, which calculated only 16 bytes of data each time.
- Therefore, when processing a large amount of data, it is necessary to frequently set hardware acceleration calculations,
- which could not make good use of the AES DMA function to improve efficiency.
- Hence, GCM implementation is replaced with CTR-based calculation which utilizes AES DMA to improve efficiency.
2022-12-28 12:14:29 +05:30
harshal.patil
e0f31edab5
test_aes_gcm: fix output_size paramter in mbedtls_get_update()
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mbedtls_get_update() returned MBEDTLS_ERR_GCM_BUFFER_TOO_SMALL,
as 0 used to get passed in the output_size paramter.
2022-12-28 11:33:09 +05:30
harshal.patil
c15b36b9c4
mbedtls: populate mbedtls_gcm_update() output_length paramater
2022-12-28 11:33:09 +05:30
Song Ruo Jing
1575b9e43a
ci: Disable all currently failed target tests for esp32c6
2022-11-28 12:09:08 +08:00
Martin Vychodil
c9c7573f71
Storage: Partition APIs moved to the new component 'esp_partition'
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All the partition handling API functions and data-types were moved from the 'spi_flash' component to the new one named 'esp_partition'. See Storage 5.x migration guide for more details
2022-11-02 21:54:45 +01:00
Song Ruo Jing
be0fdfa176
soc: Add a soc cap, SOC_CLK_RC_FAST_D256_SUPPORTED, for whether the target has the RC_FAST_D256 clock
2022-11-01 11:23:26 +08:00
Mahavir Jain
6c8f6597f9
mbedtls: test_app: keep release config enabled for ESP32
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Before `test_apps` migration, we had an independent release config,
but we can safely enable it in the default configuration for ESP32
target itself. This helps to catch any potential issues that may
occur in relevant tests because of compiler optimization flags.
2022-10-21 14:29:02 +05:30
Mahavir Jain
10dfabe650
Merge branch 'ecc/improve_mbedtls_ecdsa' into 'master'
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mbedtls: Added performance test for ECP and ECDSA operation
See merge request espressif/esp-idf!19337
2022-10-14 15:49:22 +08:00
Laukik Hase
80204ecab2
ci: Fix esp32s2.psram.test_mbedtls_psram UT
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- When PSRAM is enabled, the interrupt watchdog timeout value
needs to be increased to 800 ms from the default 500 ms.
2022-10-13 10:27:05 +05:30
Sachin Parekh
130ada60ec
mbedtls: Added performance tests for ECP and ECDSA operations
2022-10-13 10:01:06 +05:30
Laukik Hase
d7eb2c7b4e
mbedtls: MBEDTLS_PRIVATE & MBEDTLS_ALLOW_PRIVATE_ACCESS-related cleanup
2022-09-29 10:13:14 +05:30
harshal.patil
317eeddce4
fix: memory leaks check added
2022-09-17 14:31:36 +05:30
harshal.patil
146f101289
ci: Migrate mbedtls unit tests from unit-test-app to component-test-app
2022-09-17 14:31:36 +05:30
