Prefer assertions, making available functions only when caps support it
for cpu-related abstractions.
Changes cpu hal functions to stall, unstall, reset to not accept -1;
instead prefering macros that provide the same functionality.
* Let `[ignore] case` return to freedom
1) Because this test uses its own ISR, we need to release it with `esp_intr_free` instead of `pcnt_isr_service_uninstall`.
2) `pcnt_evt_queue` needs to be created before the interrupt is registered and needs to be released at the end of each case.
* Add test support for ESP32S2
* Support chip internal connection, no external wiring required.
1. add brownout detector HAL for esp32 and esp32s2
2. enable brownout reset for esp32 rev. 1 and above
3. add approximate brownout detector levels for esp32s2
The following commit refactors the CAN driver such that
it is split into HAL and Lowlevel layers. The following
changes have also been made:
- Added bit field members to can_message_t as alternative
to message flags. Updated examples and docs accordingly
- Register field names and fields of can_dev_t updated
ledc_types.h includes two similar enums, ledc_clk_src_t & ledc_clk_cfg_t. Latter was added in
ESP-IDF v4.0.
The two enums do different things but there are two similar names: LEDC_REF_TICK / LEDC_USE_REF_TICK
and LEDC_APB_CLK / LEDC_USE_APB_CLK.
Because C will accept any enum or integer value for an enum argument, there's no easy way to check
the correct enum is passed without using static analysis.
To avoid accidental errors, make the numeric values for the two similarly named enums the same.,
Noticed when looking into https://github.com/espressif/esp-idf/issues/4476
* Modify the function implementation of ESP32-S2 RTC GPIO
On ESP32 those PADs which have RTC functions must set pullup/down/capability via RTC register.
On ESP32-S2, Digital IOs have their own registers to control pullup/down/capability, independent with RTC registers.
* Add ESP32-S2 support of unit test
* Modify the pull-up test of unit test
* Modify the interrupt test of unit test
* Modify input and output mode test of unit test
1. add hal and low-level layer for timer group
2. add callback functions to handle interrupt
3. add timer deinit function
4. add timer spinlock take function
There used to be dummy phase before out phase in common command
transactions. This corrupts the data.
The code before never actually operate (clear) the QE bit, once it finds
the QE bit is set. It's hard to check whether the QE set/disable
functions work well.
This commit:
1. Cancel the dummy phase
2. Set and clear the QE bit according to chip settings, allowing tests
for QE bits. However for some chips (Winbond for example), it's not
forced to clear the QE bit if not able to.
3. Also refactor to allow chip_generic and other chips to share the same
code to read and write qe bit; let common command and read command share
configure_host_io_mode.
4. Rename read mode to io mode since maybe we will write data with quad
mode one day.
During coredump, dangerous-area-checking should be disabled, and cache
disabling should be replaced by a safer version.
Dangerous-area-checking used to be in the HAL, but it seems to be more
fit to os functions. So it's moved to os functions. Interfaces are
provided to switch between os functions during coredump.
