Song Ruo Jing
8db902c57b
gpio: Refactor pytest_gpio to separate cases with labels, and update to use new IdfDut class in pytest_embedded_idf
2022-12-20 15:28:33 +08:00
Song Ruo Jing
6d24e8bcf4
gpio: Add support for esp32c6
2022-10-18 12:38:36 +08:00
Song Ruo Jing
46886286c4
gpio: add a test case to test the ability of disabling USB D+ pin pull-up
2022-08-29 19:38:13 +08:00
Guillaume Souchere
6005cc9163
hal: Deprecate interrupt_controller_hal.h, cpu_hal.h and cpu_ll.h interfaces
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This commit marks all functions in interrupt_controller_hal.h, cpu_ll.h and cpu_hal.h as deprecated.
Users should use functions from esp_cpu.h instead.
2022-07-22 00:06:06 +08:00
Cao Sen Miao
a690a87829
spi_flash: Remove legacy spi_flash drivers
2022-07-01 11:01:34 +08:00
morris
0a36cad9e0
driver: register test app component by WHOLE_ARCHIVE
2022-04-08 15:15:05 +08:00
songruojing
8d84033b8c
gpio: Clean up unit tests and enable ci ut on some previously disabled test cases
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Eliminate UT_T1_GPIO runner requirement by routing internally through gpio matrix and by setting gpio pins to GPIO_MODE_INPUT_OUTPUT mode for all interrupt related test cases.
2022-03-30 15:11:08 +08:00
songruojing
11e555d677
unit test: move gpio, dedicated_gpio, sigmadelta unit test from unit-test-app to components/driver/test_apps/gpio
2022-03-30 15:11:08 +08:00
