Disables app image integrity checks when running under OpenOCD control.
Allows setting breakpoints in flash before application start (just after reset).
1. Bootloader reads SPI configuration from bin header, so that the burning configuration can be different with compiling configuration.
2. Psram mode init will overwrite original flash speed mode, so that users can change psram and flash speed after OTA. 3. Flash read mode(QIO/DIO…) will not be changed in app bin. It is decided by bootloader, OTA can not change this mode.
4. Add read flash ID function, and save flash ID in g_rom_flashchip
5. Set drive ability for all related GPIOs
6. Check raise VDDSDIO voltage in 80Mhz mode
7. Add check flash ID and update settings in bootloader
8. Read flash ID once and keep in global variable
9. Read flash image header once and reuse the result
Tested cases:
1. Test new and old version of bootloader
boot Flash 20M —> app Flash 80M + Psram 80M
boot Flash 40M —> app Flash 80M + Psram 80M
boot Flash 80M —> app Flash 80M + Psram 80M
boot Flash 20M —> app Flash 80M + Psram 40M
boot Flash 40M —> app Flash 80M + Psram 40M
boot Flash 80M —> app Flash 80M + Psram 40M
boot Flash 20M —> app Flash 40M + Psram 40M
boot Flash 40M —> app Flash 40M + Psram 40M
boot Flash 80M —> app Flash 40M + Psram 40M 2. Working after esp_restart reboot.
Need to make the bootloader modular so that users can redefine its functional part.
- refactoring and moving functions to the bootloader_support component
- Changed function to `void` bootloader_utility_load_image(...);
TW19596
1. External 32kHz crystal is started for too long or it may not start at all. It is often observed at the first start.
2. At the first start, it is possible that the crystal did not start. And the recorded period was recorded as 0. Which led to a division error by zero during the transition to the deep sleep mode (Maybe somewhere else).
3. Added a unit test to test a new method of oscillation an external crystal.
4. Added a new method of oscillating of an external crystal. The legs of the crystal are fed with a 32 kHz frequency.
The new method eliminates these errors.
Added unit test: `\esp-idf\components\soc\esp32\test\test_rtc_clk.c`: `make TEST_COMPONENTS=soc`
- 8 Test starting external RTC crystal. Will pass.
`Bootstrap cycles for external 32kHz crystal` - is specified in the file Kconfig by default 100.
QA tested a new method of oscillation the crystal on 25 boards. The supply of square waves on the crystal showed a 100% result in contrast to the previous method of launching the crystal. After the tests, the old method was deleted.
Closes TW19143
Makes app image booting more reliable (256-bit rather than 8-bit verification.)
Some measurements, time to boot a 655KB app.bin file and run to app_main() execution.
(All for rev 1 silicon, ie no 340ms spurious WDT delay.)
80MHz QIO mode:
before = 300ms
after = 140ms
40MHz DIO mode:
before = 712ms
after = 577ms
40MHz DIO mode, secure boot enabled
before = 1380ms
after = 934ms
(Secure boot involves two ECC signature verifications (partition table, app) that take approx 300ms each with 80MHz CPU.)
1. When dual core cpu run access DPORT register, must do protection.
2. If access DPORT register, must use DPORT_REG_READ/DPORT_REG_WRITE and DPORT_XXX register operation macro.
1) fixed SPI_read_status: added check for flash busy flag in matrix mode
2) fixed SPI_page_program: enable write before writing data to SPI FIFO
3) SPI flash ROM funcs replacement is controlled via menuconfig option
Partition/SPI/OTA docs & OTA new functionality
* Update partition, SPI flash & OTA docs to reflect functionality changes
* Refactor OTA implementation to perform checks mentioned in API doc
* Add new functions to OTA API: esp_ota_get_running_partition() & esp_ota_get_next_update_partition() functions
* Add spi_flash_cache2phys() & spi_flash_phys2cache() functions to support esp_ota_get_running_partition()
See merge request !513
Bootloader enables SAR ADC in test mode to get some entropy for the RNG.
The bits which control the ADC test mux were not disabled, which caused
extra ~24uA current to be drawn from VRTC, increasing deep sleep current
consumption. This change disables relevant test mode bits in
bootloader_random_disable.
* App access functions are all flash encryption-aware
* Documentation for flash encryption
* Partition read/write is flash aware
* New encrypted write function
SHA hardware allows each of SHA1, SHA256, SHA384&SHA512 to calculate digests
concurrently.
Currently incompatible with AES acceleration due to a hardware reset problem.
Ref TW7111.
Default esp-idf builds now show -Wextra warnings (except for a few:
signed/unsigned comparison, unused parameters, old-style C declarations.)
CI building of examples runs with that level raised to -Werror, to catch
those changes going into the main repo.
