When `DIS_USB_JTAG` eFuse is NOT burned (`False`), it is not possible
to set pins 18 and 19 as GPIOs. This commit solves this by manually
disabling USB JTAG when using pins 18 or 19.
The functions shall use `gpio_hal_iomux_func_sel` instead of
`PIN_FUNC_SELELECT`.
There is no ccomp timer on C3, which means our performance tests will start
failing again due to variance caused by cache misses.
This MR adds TEST_PERFORMANCE_CCOMP_ macro that will only fail
performance test if CCOMP timer is supported on the target
esp_system: removed repeated interrupt allocator code and moved common code to esp_system
xtens: moved xtensa specific code from freertos to the xtensa component
hal/interrupt_controller: added interrupt controller hal and ll files
docs: update the doxyfile with new location of esp_itr_alloc.h file
xtensa: fixed dangerous relocation problem after moving xtensa interrupt files out of freertos
docs: removed Xtensa reference from intr_allocator api-reference
xtensa: pushed the interrupt function that manages non iram interrupts to the xtensa layer
esp_system/test: fixed platform dependent setting for intr_allocator tests
hal: rename the functions used to manage non iram interrupt mask.
* partition api changed from spi_flash* API to
esp_partition* API and is abstracted as a C++
interface.
* The old nvs encryption is still possible
* changed default unit test app partition table
* Partitions coming from esp_partition API are
checked for generic flash encryption. If yes,
an error is returned since generic flash
encryption isn't compatible with nvs
encryption
* esp32, esp32s2 tests don't require nvs_flash
but mbedtls now
Closes IDF-1340
Closes IDF-858
* changing dependencies from unity->cmock
* added component.mk and Makefile.projbuild
* ignore test dir in gen_esp_err_to_name.py
* added some brief introduction of CMock in IDF
If esp_restart_noos() is run and the stack address points to external memory (SPIRAM)
then Cache_Read_Disable() raises up the error "Cache disabled but cached memory region accessed"
to fix this we switch stack to internal RAM before disable cache.
Added unit tests.
Closes: https://github.com/espressif/esp-idf/issues/5107
Activated AES, RSA and SHA hardware acceleration for esp32s2 and enabled related unit tests.
Updated with changes made for ESP32 from 0a04034, 961f59f and caea288.
Added performance targets for esp32s2beta
Closes IDF-757
The test case may run after an RTC_WDT_RESET (if we are on rev. 0
ESP32), or software reset (when running test cases locally).
Also moving the test case next to the other timer group driver tests.
1. add hal and low-level layer for timer group
2. add callback functions to handle interrupt
3. add timer deinit function
4. add timer spinlock take function
