Too short timeouts often cause useless failures on large-capacity SDs (16GB+)
Fixed by adding 60 sec timeout on new "Filesystem mounted" checkpoint
JIRA IDF-3741
Partially reverted 08f1bbe0c7.
The host should have this flexibility, which is consistent to the cs_hold argument.
However, the user should know as less as possible about the host.
So the wrapper layer (esp_flash_spi_init.c) should cover this, helping to set cs_setup to 1, to meet the common requirements.
Regression in 66fb5a29bb - whitespace cleanup
added trailing newline (\n) to the end of the file, which is printed as \r\n by
IDF printf, so the 'expect' fails to see it.
During HAL layer refactoring and new chip bringup, we have several
caps.h for each part, to reduce the conflicts to minimum. But this is
The capabilities headers will be relataive stable once completely
written (maybe after the featues are supported by drivers).
Now ESP32 and ESP32-S2 drivers are relative stable, making it a good
time to combine all these caps.h into one soc_caps.h
This cleanup also move HAL config and pin config into separated files,
to make the responsibilities of these headers more clear. This is
helpful for the stabilities of soc_caps.h because we want to make it
public some day.
* If esp_vfs_spiffs_register is called with an explicit partition
label, other SPIFFS functions (info, format, unregister) must be
called with the same label.
* On the other hand, if label was NULL in the call to
esp_vfs_spiffs_register and the first matching partition was used,
calls to the rest of the SPIFFS functions should be done with NULL
partition_label argument.
Fix the Doxygen documentation. Update the example accordingly, in case
a user modifies "partition_label" value in esp_vfs_spiffs_conf_t conf
initializer.
Closes https://github.com/espressif/esp-idf/issues/4450
DIO works with the same connections as Fast Read, so use it by
default. Also correct the note in README.md which says that DIO
requires additional pins.
The build system automatically determines offsets of partitions from
the partition table, so no manual changes are needed. Instead, add a
note that partition offsets may need to be updated when increasing
the bootloader size.
This change adds a check for compatibility between the nvs version
found on nvs flash and the one assumed by running code during nvs
initialization. Any mismatch is reported to the user using new error
code ESP_ERR_NVS_NEW_VERSION_FOUND.
Some development boards do not have sufficient external pull-ups on
SD card pins. Most notably, if high level on GPIO13 is not registered
by the card when GO_IDLE_STATE command is received, the card will enter
SPI mode and further communication will not be possible, until power to
the card is toggled.
This change enables internal pull-ups on SD card pins in an attempt to
make this initialization process more reliable.
SD SPI mode driver
This MR adds functionality to support SD cards connected via SPI interface.
Additionally, two bugs are fixed:
- Definition of `SPI_TRANS_MODE_DIOQIO_ADDR` in spi_master driver
- SD card probing frequency was 4000kHz instead of 400kHz as required by the standard
See merge request !727
NVS is used to store PHY calibration data, WiFi configuration, and BT
configuration. Previously BT examples did not call nvs_flash_init,
relying on the fact that it is called during PHY init. However PHY init
did not handle possible NVS initialization errors.
This change moves PHY init procedure into the application, and adds
diagnostic messages to BT config management routines if NVS is not
initialized.
* Use "example" in all example function & variable names,
ie use i2c_example_xxx instead of i2c_xxx for example functions.
Closes#198https://github.com/espressif/esp-idf/issues/198
* Mark example functions, etc. static
* Replace uses of "test" & "demo" with "example"
* Split the UART example into two
* Rename "main" example files to end with "_main.c" for disambiguation
nvs_flash_init may return an error code in some cases, and applications
should check this error code (or at least assert on it being ESP_OK, to
make potential issues more immediately obvious).
This change modifies all the examples which use NVS to check the error
code. Most examples get a simple ESP_ERROR_CHECK assert, while NVS
examples, OTA example, and NVS unit tests get a more verbose check which
may be used in real applications.
* New "espefuse.py set_flash_voltage" command to easily set a fix
VDD_SDIO regulator voltage (1.8V, 3.3V or disabled).
* Fixes bugs when flashing files with non-4-byte aligned lengths
(doesn't effect esp-idf image files)
* README improvements
