This commit does the following
- Add power management lock to CAN driver so that APB frequency does not change
whilst CAN driver is in use
- Fix incorrect flag in can_transmit()
- Refactor can_driver_install() and can_driver_uninstall() so that critical sections
are shorter
- Fix CAN gpio configuration bug on RX pin. Closes#2302
- Add docs about multiple ID configuration and fix example links
Problem:
The new API esp_bt_mem_release() that was added freed BTDM data to heap from esp_bt_controller_mem_release().
Now with the BT memory optimization commit ee787085f9,
the BTDM data is optimized and reduced to only 32 bytes which is not sufficient amount to be added to heap.
So, using the API leads to assert saying that the region is too small.
Solution:
Modify heap_caps_add_region_with_caps to return ESP_ERR_INVALID_SIZE in case the range is too small to create a new heap.
Do not assert if return value is ESP_ERR_INVALID_SIZE
This also fixes using API esp_bt_controller_mem_release() with ESP_BT_MODE_BTDM
Signed-off-by: Hrishikesh Dhayagude <hrishi@espressif.com>
Guarantees that a component's project_include.cmake will be called after its dependent components'
project_include.cmake. Because of cycles in the dependency graph, this is less useful than you'd
think but it gives a strong guarantee for any component which is not part of a cycle.
Also applies deterministic ordering (ordering is initialised as COMPONENT_REQUIRES_COMMON then all
COMPONENTS in alphabetical order, but then the sorting by dependencies is applied.)
Eclipse was unable to resolve the std::mutex type eventhough the mutex header file was succesfully included. By adding this modification, the issues was resolved.
Some APs transmit AMPDU and MPDU by turns. Moreover, the sequence
numbers of AMPDU and MPDU are out of order, e.g. MPDU(1253) -
AMPDU(1251, 1252) - MPDU(1254) - AMPDU(1255, 1256). In order to
receive both AMPDU and MPDU in order, MPDU must be reordered with
AMPDU.
1. New tests for SD card on slot 0. Currently frequency for 4-bit mode
has to be reduced in the test.
2. Change pin for CD/WP tests, re-enable CD tests.
Works for 3.3V eMMC in 4 line mode.
Not implemented:
- DDR mode for SD cards (UHS-I) also need voltage to be switched to 1.8V.
- 8-line DDR mode for eMMC to be implemented later.
This introduces the following changes in the example test scripts :
* Dependency on python requests library removed in favor of httplib
* Bug fixed in the logic responsible for receiving and processing http chunked responses
* Default timeouts increased Note : Due to connectivity issues (between runner host and DUT) in the runner environment, some of the advanced_tests are being ignored. These tests are intended for verifying the expected limits of the http_server capabilities, and implement sending and receiving of large HTTP packets and malformed requests, running multiple parallel sessions, etc. It is advised that all these tests be run locally, when making changes or adding new features to this component.
