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esp_flash: improve unit test to detect over boundary issue

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This commit is contained in:
Michael (XIAO Xufeng) 2020-05-03 23:03:29 +08:00
parent a9c8895bb2
commit f99ba33920
1 changed files with 18 additions and 7 deletions
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25
components/spi_flash/test/test_esp_flash.c
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@ -382,7 +382,8 @@ void test_simple_read_write(esp_flash_t *chip)
srand(test_seed); srand(test_seed);
for (int i = 0; i < sizeof(sector_buf); i++) { for (int i = 0; i < sizeof(sector_buf); i++) {
TEST_ASSERT_EQUAL_HEX8(rand() & 0xFF, sector_buf[i]); uint8_t data = rand();
TEST_ASSERT_EQUAL_HEX8(data, sector_buf[i]);
} }
} }
@ -412,17 +413,22 @@ FLASH_TEST_CASE_3("SPI flash unaligned read/write", test_unaligned_read_write);
void test_single_read_write(esp_flash_t* chip) void test_single_read_write(esp_flash_t* chip)
{ {
const int seed = 699;
ESP_LOGI(TAG, "Testing chip %p...", chip); ESP_LOGI(TAG, "Testing chip %p...", chip);
uint32_t offs = erase_test_region(chip, 2); uint32_t offs = erase_test_region(chip, 2);
srand(seed);
for (unsigned v = 0; v < 512; v++) { for (unsigned v = 0; v < 512; v++) {
TEST_ASSERT_EQUAL_HEX(ESP_OK, esp_flash_write(chip, &v, offs + v, 1) ); uint32_t data = rand();
TEST_ASSERT_EQUAL_HEX(ESP_OK, esp_flash_write(chip, &data, offs + v, 1) );
} }
srand(seed);
for (unsigned v = 0; v < 512; v++) { for (unsigned v = 0; v < 512; v++) {
uint8_t readback; uint8_t readback;
uint32_t data = rand();
TEST_ASSERT_EQUAL_HEX(ESP_OK, esp_flash_read(chip, &readback, offs + v, 1) ); TEST_ASSERT_EQUAL_HEX(ESP_OK, esp_flash_read(chip, &readback, offs + v, 1) );
TEST_ASSERT_EQUAL_HEX8(v, readback); TEST_ASSERT_EQUAL_HEX8(data, readback);
} }
} }
@ -435,18 +441,23 @@ FLASH_TEST_CASE_3("SPI flash single byte reads/writes", test_single_read_write);
*/ */
void test_three_byte_read_write(esp_flash_t *chip) void test_three_byte_read_write(esp_flash_t *chip)
{ {
const int seed = 700;
ESP_LOGI(TAG, "Testing chip %p...", chip); ESP_LOGI(TAG, "Testing chip %p...", chip);
uint32_t offs = erase_test_region(chip, 2); uint32_t offs = erase_test_region(chip, 2);
ets_printf("offs:%X\n", offs); ets_printf("offs:%X\n", offs);
for (uint32_t v = 0; v < 2000; v++) { srand(seed);
TEST_ASSERT_EQUAL(ESP_OK, esp_flash_write(chip, &v, offs + 3 * v, 3) ); for (uint32_t v = 0; v < 86; v++) {
uint32_t data = rand();
TEST_ASSERT_EQUAL(ESP_OK, esp_flash_write(chip, &data, offs + 3 * v, 3) );
} }
for (uint32_t v = 0; v < 2000; v++) { srand(seed);
for (uint32_t v = 0; v < 1; v++) {
uint32_t readback; uint32_t readback;
uint32_t data = rand();
TEST_ASSERT_EQUAL(ESP_OK, esp_flash_read(chip, &readback, offs + 3 * v, 3) ); TEST_ASSERT_EQUAL(ESP_OK, esp_flash_read(chip, &readback, offs + 3 * v, 3) );
TEST_ASSERT_EQUAL_HEX32(v & 0xFFFFFF, readback & 0xFFFFFF); TEST_ASSERT_EQUAL_HEX32(data & 0xFFFFFF, readback & 0xFFFFFF);
} }
} }