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synced 2024-10-05 20:47:46 -04:00
esp_flash: fix the regression of non-quad mode by default chip driver
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@ -77,6 +77,8 @@ static IRAM_ATTR NOINLINE_ATTR void cs_initialize(esp_flash_t *chip, const esp_f
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//initialization, disable the cache temporarily
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chip->os_func->start(chip->os_func_data);
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if (use_iomux) {
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// This requires `gpio_iomux_in` and `gpio_iomux_out` to be in the IRAM.
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// `linker.lf` is used fulfill this requirement.
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gpio_iomux_in(cs_io_num, spics_in);
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gpio_iomux_out(cs_io_num, spics_func, false);
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} else {
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@ -181,6 +183,7 @@ static DRAM_ATTR esp_flash_t default_chip = {
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esp_err_t esp_flash_init_default_chip(void)
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{
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memspi_host_config_t cfg = ESP_FLASH_HOST_CONFIG_DEFAULT();
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//the host is already initialized, only do init for the data and load it to the host
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spi_flash_hal_init(&default_driver_data, &cfg);
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default_chip.host->driver_data = &default_driver_data;
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@ -35,6 +35,8 @@ static const spi_flash_chip_t *default_registered_chips[] = {
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#ifdef CONFIG_SPI_FLASH_SUPPORT_GD_CHIP
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&esp_flash_chip_gd,
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#endif
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// Default chip drivers that will accept all chip ID.
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// FM, Winbond and XMC chips are supposed to be supported by this chip driver.
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&esp_flash_chip_generic,
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NULL,
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};
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@ -456,12 +456,15 @@ esp_err_t spi_flash_common_set_io_mode(esp_flash_t *chip, esp_flash_wrsr_func_t
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esp_err_t ret = ESP_OK;
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const bool is_quad_mode = esp_flash_is_quad_mode(chip);
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bool update_config = false;
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const bool force_check = true; //in case some chips doesn't support erase QE
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/*
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* By default, we don't clear the QE bit even the flash mode is not QIO or QOUT. Force clearing
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* QE bit by the generic chip driver (command 01H with 2 bytes) may cause the output of some
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* chips (MXIC) no longer valid.
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* Enable this option when testing a new flash chip for clearing of QE.
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*/
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const bool force_check = false;
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bool need_check = is_quad_mode;
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if (force_check) {
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need_check = true;
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}
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bool need_check = is_quad_mode || force_check;
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uint32_t sr_update;
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if (need_check) {
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@ -77,6 +77,9 @@ typedef void (*flash_test_func_t)(esp_flash_t* chip);
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#define FLASH_TEST_CASE(STR, FUNC_TO_RUN) \
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TEST_CASE(STR, "[esp_flash]") {flash_test_func(FUNC_TO_RUN, 1 /* first index reserved for main flash */ );}
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#define FLASH_TEST_CASE_IGNORE(STR, FUNC_TO_RUN) \
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TEST_CASE(STR, "[esp_flash][ignore]") {flash_test_func(FUNC_TO_RUN, 1 /* first index reserved for main flash */ );}
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/* Use FLASH_TEST_CASE_3 for tests which also run on external flash, which sits in the place of PSRAM
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(these tests are incompatible with PSRAM)
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@ -84,9 +87,13 @@ typedef void (*flash_test_func_t)(esp_flash_t* chip);
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*/
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#if defined(CONFIG_SPIRAM_SUPPORT) || TEMPORARY_DISABLED_FOR_TARGETS(ESP32S2BETA)
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#define FLASH_TEST_CASE_3(STR, FUNCT_TO_RUN)
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#define FLASH_TEST_CASE_3_IGNORE(STR, FUNCT_TO_RUN)
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#else
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#define FLASH_TEST_CASE_3(STR, FUNC_TO_RUN) \
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TEST_CASE(STR", 3 chips", "[esp_flash][test_env=UT_T1_ESP_FLASH]") {flash_test_func(FUNC_TO_RUN, TEST_CONFIG_NUM);}
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#define FLASH_TEST_CASE_3_IGNORE(STR, FUNC_TO_RUN) \
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TEST_CASE(STR", 3 chips", "[esp_flash][test_env=UT_T1_ESP_FLASH][ignore]") {flash_test_func(FUNC_TO_RUN, TEST_CONFIG_NUM);}
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#endif
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//currently all the configs are the same with esp_flash_spi_device_config_t, no more information required
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@ -502,7 +509,7 @@ esp_err_t esp_flash_set_io_mode(esp_flash_t* chip, bool qe);
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esp_err_t esp_flash_get_io_mode(esp_flash_t* chip, bool* qe);
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esp_err_t esp_flash_read_chip_id(esp_flash_t* chip, uint32_t* flash_id);
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static bool check_winbond_chip(esp_flash_t* chip)
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static bool is_winbond_chip(esp_flash_t* chip)
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{
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uint32_t flash_id;
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esp_err_t ret = esp_flash_read_chip_id(chip, &flash_id);
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@ -524,14 +531,15 @@ static void test_toggle_qe(esp_flash_t* chip)
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esp_err_t ret = esp_flash_get_io_mode(chip, &qe);
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TEST_ESP_OK(ret);
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bool is_winbond_chip = check_winbond_chip(chip);
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bool allow_failure = is_winbond_chip(chip);
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for (int i = 0; i < 4; i ++) {
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ESP_LOGI(TAG, "write qe: %d->%d", qe, !qe);
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qe = !qe;
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chip->read_mode = qe? SPI_FLASH_QOUT: SPI_FLASH_SLOWRD;
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ret = esp_flash_set_io_mode(chip, qe);
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if (is_winbond_chip && !qe && ret == ESP_ERR_FLASH_NO_RESPONSE) {
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if (allow_failure && !qe && ret == ESP_ERR_FLASH_NO_RESPONSE) {
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//allows clear qe failure for Winbond chips
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ret = ESP_OK;
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}
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@ -541,8 +549,12 @@ static void test_toggle_qe(esp_flash_t* chip)
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ret = esp_flash_get_io_mode(chip, &qe_read);
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TEST_ESP_OK(ret);
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ESP_LOGD(TAG, "qe read: %d", qe_read);
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if (qe != qe_read && !qe && is_winbond_chip) {
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ESP_LOGE(TAG, "cannot clear QE bit, this may be normal for Winbond chips.");
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if (!qe && qe_read) {
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if (allow_failure) {
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ESP_LOGW(TAG, "cannot clear QE bit for known permanent QE (Winbond) chips.");
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} else {
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ESP_LOGE(TAG, "cannot clear QE bit, please make sure force clearing QE option is enabled in `spi_flash_common_set_io_mode`, and this chip is not a permanent QE one.");
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}
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chip->read_mode = io_mode_before;
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return;
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}
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@ -552,8 +564,11 @@ static void test_toggle_qe(esp_flash_t* chip)
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chip->read_mode = io_mode_before;
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}
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FLASH_TEST_CASE("Test esp_flash_write can toggle QE bit", test_toggle_qe);
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FLASH_TEST_CASE_3("Test esp_flash_write can toggle QE bit", test_toggle_qe);
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// These tests show whether the QE is permanent or not for the chip tested.
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// To test the behaviour of a new SPI flash chip, enable force_check flag in generic driver
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// `spi_flash_common_set_io_mode` and then run this test.
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FLASH_TEST_CASE_IGNORE("Test esp_flash_write can toggle QE bit", test_toggle_qe);
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FLASH_TEST_CASE_3_IGNORE("Test esp_flash_write can toggle QE bit", test_toggle_qe);
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void test_permutations(flashtest_config_t* config)
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