Merge branch 'docs/fix_typo_adc_oneshot_v5.1' into 'release/v5.1'
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docs: fix a typo in adc_oneshot (v5.1)

See merge request espressif/esp-idf!33008
This commit is contained in:
Jiang Jiang Jian 2024-08-22 19:44:26 +08:00
commit e026fd1f81
2 changed files with 2 additions and 2 deletions

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@ -142,7 +142,7 @@ where:
* - Vmax * - Vmax
- Maximum measurable input analog voltage, this is related to the ADC attenuation, please refer to `TRM <{IDF_TARGET_TRM_EN_URL}>`__ > ``On-Chip Sensor and Analog Signal Processing``. - Maximum measurable input analog voltage, this is related to the ADC attenuation, please refer to `TRM <{IDF_TARGET_TRM_EN_URL}>`__ > ``On-Chip Sensor and Analog Signal Processing``.
* - Dmax * - Dmax
- Maximum of the output ADC raw digital reading result, which is 2^bitwidth, where bitwidth is the :cpp:member::`adc_oneshot_chan_cfg_t:bitwidth` configured before. - Maximum of the output ADC raw digital reading result, which is 2^bitwidth, where bitwidth is the :cpp:member:`adc_oneshot_chan_cfg_t::bitwidth` configured before.
To do further calibration to convert the ADC raw result to voltage in mV, please refer to calibration doc :doc:`adc_calibration`. To do further calibration to convert the ADC raw result to voltage in mV, please refer to calibration doc :doc:`adc_calibration`.

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@ -143,7 +143,7 @@ ADC 单次转换模式驱动基于 {IDF_TARGET_NAME} SAR ADC 模块实现,不
* - Vmax * - Vmax
- 可测量的最大模拟输入电压,与 ADC 衰减相关,请参考 `技术参考手册 <{IDF_TARGET_TRM_CN_URL}>`__ > ``片上传感器与模拟信号处理`` - 可测量的最大模拟输入电压,与 ADC 衰减相关,请参考 `技术参考手册 <{IDF_TARGET_TRM_CN_URL}>`__ > ``片上传感器与模拟信号处理``
* - Dmax * - Dmax
- 输出 ADC 原始数字读取结果的最大值,即 2^位宽,位宽即之前配置的 :cpp:member:`adc_digi_pattern_config_t::bit_width`。 - 输出 ADC 原始数字读取结果的最大值,即 2^位宽,位宽即之前配置的 :cpp:member:`adc_oneshot_chan_cfg_t::bitwidth`。
若需进一步校准,将 ADC 原始结果转换为以 mV 为单位的电压数据,请参考校准文档 :doc:`adc_calibration` 若需进一步校准,将 ADC 原始结果转换为以 mV 为单位的电压数据,请参考校准文档 :doc:`adc_calibration`