CI: reduce usage of sdio runners

This commit is contained in:
Chen Yudong 2022-07-22 15:02:00 +08:00
parent 2be53e6765
commit 9b44bc1d31
3 changed files with 918 additions and 11 deletions

View File

@ -159,22 +159,25 @@ build:integration_test:
# To reduce the specific runners' usage.
# Do not create these jobs by default patterns on development branches
# Can be triggered by labels or related changes
"test:example_test-{0}-{1}":
"test:{0}-{1}-{2}":
matrix:
- *target_test
- *all_targets
- - bt # example_test_005
- wifi # example_test_002, example_test*wifi*
- ethernet # example_test*ethernet*
- sdio # UT_044, UT_045
patterns:
- "example_test-{0}-{1}"
- "example_test-{1}"
- "{0}-{1}-{2}"
- "{0}-{2}"
- "target_test-{2}"
labels:
- "example_test_{0}"
- example_test
- "{0}_{1}"
- "{0}"
- target_test
included_in:
- "build:example_test-{0}"
- "build:example_test"
- "build:{0}-{1}"
- "build:{0}"
- build:target_test
# For example_test*flash_encryption_wifi_high_traffic jobs

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@ -873,13 +873,17 @@ UT_043:
- psram
UT_044:
extends: .unit_test_esp32_template
extends:
- .unit_test_esp32_template
- .rules:test:unit_test-esp32-sdio
tags:
- ESP32_IDF
- UT_SDIO
UT_045:
extends: .unit_test_esp32_template
extends:
- .unit_test_esp32_template
- .rules:test:unit_test-esp32-sdio
tags:
- ESP32_IDF
- UT_SDIO