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esp_adc: added comments to c3 test thresh, also sync to legacy tests

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Armando 2022-09-13 11:39:12 +08:00 committed by Armando (Dou Yiwen)
parent eee5085281
commit 7be7a3e996
2 changed files with 5 additions and 11 deletions
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12
components/driver/test_apps/legacy_adc_driver/main/test_legacy_adc.c
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@ -27,14 +27,14 @@
#elif CONFIG_IDF_TARGET_ESP32S2
#define ADC_TEST_LOW_VAL 0
#define ADC_TEST_LOW_THRESH 25
#define ADC_TEST_LOW_THRESH 35
#define ADC_TEST_HIGH_VAL 8191
#define ADC_TEST_HIGH_THRESH 10
#elif CONFIG_IDF_TARGET_ESP32C3
#define ADC_TEST_LOW_VAL 0
#define ADC_TEST_LOW_THRESH 50
#define ADC_TEST_LOW_THRESH 60 //This is due to ADC2 accuracy is not as good as ADC1, and also we use weak pulldown
#define ADC_TEST_HIGH_VAL 4095
#define ADC_TEST_HIGH_THRESH 10
@ -48,17 +48,11 @@
#elif CONFIG_IDF_TARGET_ESP32C2
#define ADC_TEST_LOW_VAL 2147
#define ADC_TEST_LOW_THRESH 50
#define ADC_TEST_LOW_THRESH 100
#define ADC_TEST_HIGH_VAL 4095
#define ADC_TEST_HIGH_THRESH 0
#elif CONFIG_IDF_TARGET_ESP32H2
#define ADC_TEST_LOW_VAL 2147
#define ADC_TEST_LOW_THRESH 50
#define ADC_TEST_HIGH_VAL 4095
#define ADC_TEST_HIGH_THRESH 0
#endif
//ADC Channels

4
components/esp_adc/test_apps/adc/main/test_common_adc.h
View File

@ -72,7 +72,7 @@ void test_adc_calibration_deinit(adc_cali_handle_t handle);
#elif CONFIG_IDF_TARGET_ESP32C3
#define ADC_TEST_LOW_VAL 0
#define ADC_TEST_LOW_THRESH 60
#define ADC_TEST_LOW_THRESH 60 //This is due to ADC2 accuracy is not as good as ADC1, and also we use weak pulldown
#define ADC_TEST_HIGH_VAL 4095
#define ADC_TEST_HIGH_VAL_DMA 4095
@ -88,7 +88,7 @@ void test_adc_calibration_deinit(adc_cali_handle_t handle);
#elif CONFIG_IDF_TARGET_ESP32C2
#define ADC_TEST_LOW_VAL 2147
#define ADC_TEST_LOW_THRESH 50
#define ADC_TEST_LOW_THRESH 100
#define ADC_TEST_HIGH_VAL 4095
#define ADC_TEST_HIGH_THRESH 0