Merge branch 'ci/enable_i2c_test_v4.3' into 'release/v4.3'

I2C: enable all unit test for i2c on esp32c3 (backport 4.3)

See merge request espressif/esp-idf!13061
This commit is contained in:
Michael (XIAO Xufeng) 2021-04-28 15:00:20 +00:00
commit 52d9d466fb
5 changed files with 73 additions and 13 deletions

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@ -267,7 +267,7 @@ TEST_CASE("I2C driver memory leaking check", "[i2c]")
TEST_ASSERT_INT_WITHIN(100, size, esp_get_free_heap_size());
}
#if !TEMPORARY_DISABLED_FOR_TARGETS(ESP32S2, ESP32S3, ESP32C3)
#if !TEMPORARY_DISABLED_FOR_TARGETS(ESP32S2, ESP32S3)
// print the reading buffer
static void disp_buf(uint8_t *buf, int len)
@ -397,7 +397,7 @@ static void slave_write_buffer_test(void)
TEST_CASE_MULTIPLE_DEVICES("I2C master read slave test", "[i2c][test_env=UT_T2_I2C][timeout=150]", master_read_slave_test, slave_write_buffer_test);
#if !TEMPORARY_DISABLED_FOR_TARGETS(ESP32S2, ESP32, ESP32C3)
#if !TEMPORARY_DISABLED_FOR_TARGETS(ESP32S2, ESP32)
static void i2c_master_write_read_test(void)
{
uint8_t *data_rd = (uint8_t *) malloc(DATA_LENGTH);
@ -538,8 +538,8 @@ static void i2c_slave_repeat_read(void)
TEST_CASE_MULTIPLE_DEVICES("I2C repeat write test", "[i2c][test_env=UT_T2_I2C][timeout=150]", i2c_master_repeat_write, i2c_slave_repeat_read);
#endif //!TEMPORARY_DISABLED_FOR_TARGETS(ESP32S2, ESP32S3, ESP32C3)
#endif //!TEMPORARY_DISABLED_FOR_TARGETS(ESP32S2, ESP32S3, ESP32C3)
#endif //!TEMPORARY_DISABLED_FOR_TARGETS(ESP32S2, ESP32S3)
#endif //!TEMPORARY_DISABLED_FOR_TARGETS(ESP32S2, ESP32S3)
static volatile bool exit_flag;
static bool test_read_func;

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@ -903,6 +903,7 @@ static inline void i2c_ll_slave_init(i2c_dev_t *hw)
ctrl_reg.sda_force_out = 1;
ctrl_reg.scl_force_out = 1;
hw->ctr.val = ctrl_reg.val;
hw->ctr.slv_tx_auto_start_en = 1;
hw->fifo_conf.fifo_addr_cfg_en = 0;
}

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@ -892,6 +892,7 @@ static inline void i2c_ll_slave_init(i2c_dev_t *hw)
ctrl_reg.sda_force_out = 1;
ctrl_reg.scl_force_out = 1;
hw->ctr.val = ctrl_reg.val;
hw->ctr.slv_tx_auto_start_en = 1;
hw->fifo_conf.fifo_addr_cfg_en = 0;
}

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@ -32,12 +32,23 @@ using namespace idf;
#define MAGIC_TEST_NUMBER 47
#define I2C_SLAVE_NUM I2C_NUM_0 /*!<I2C port number for slave dev */
#if CONFIG_IDF_TARGET_ESP32C3
#define I2C_SLAVE_SCL_IO 5 /*!<gpio number for i2c slave clock */
#define I2C_SLAVE_SDA_IO 6 /*!<gpio number for i2c slave data */
#else
#define I2C_SLAVE_SCL_IO 19 /*!<gpio number for i2c slave clock */
#define I2C_SLAVE_SDA_IO 18 /*!<gpio number for i2c slave data */
#endif
#if CONFIG_IDF_TARGET_ESP32C3
#define I2C_MASTER_NUM I2C_NUM_0 /*!< I2C port number for master dev */
#define I2C_MASTER_SCL_IO 5 /*!<gpio number for i2c master clock */
#define I2C_MASTER_SDA_IO 6 /*!<gpio number for i2c master data */
#else
#define I2C_MASTER_NUM I2C_NUM_1 /*!< I2C port number for master dev */
#define I2C_MASTER_SCL_IO 19 /*!< gpio number for I2C master clock */
#define I2C_MASTER_SDA_IO 18 /*!< gpio number for I2C master data */
#define I2C_MASTER_SDA_IO 18 /*!< gpio number for I2C master data */
#endif
struct MasterFixture {
MasterFixture(const vector<uint8_t> &data_arg = {47u}) :
@ -59,7 +70,7 @@ TEST_CASE("I2CMaster SDA and SCL equal", "[cxx i2c][leaks=300]")
}
// TODO The I2C driver tests are disabled, so disable them here, too. Probably due to no runners.
#if !TEMPORARY_DISABLED_FOR_TARGETS(ESP32S2, ESP32S3, ESP32C3)
#if !TEMPORARY_DISABLED_FOR_TARGETS(ESP32S2, ESP32S3)
static void i2c_slave_read_raw_byte(void)
{
@ -107,7 +118,7 @@ static void i2c_slave_read_multiple_raw_bytes(void)
static void i2c_slave_write_multiple_raw_bytes(void)
{
I2CSlave slave(1, I2C_SLAVE_SCL_IO, I2C_SLAVE_SDA_IO, ADDR, 512, 512);
I2CSlave slave(I2C_SLAVE_NUM, I2C_SLAVE_SCL_IO, I2C_SLAVE_SDA_IO, ADDR, 512, 512);
uint8_t WRITE_BUFFER [8] = {0, 1, 2, 3, 4, 5, 6, 7};
unity_wait_for_signal("master init");
@ -120,7 +131,7 @@ static void i2c_slave_write_multiple_raw_bytes(void)
static void i2c_slave_composed_trans(void)
{
I2CSlave slave(1, I2C_SLAVE_SCL_IO, I2C_SLAVE_SDA_IO, ADDR, 512, 512);
I2CSlave slave(I2C_SLAVE_NUM, I2C_SLAVE_SCL_IO, I2C_SLAVE_SDA_IO, ADDR, 512, 512);
size_t BUF_SIZE = 2;
const uint8_t SLAVE_WRITE_BUFFER [BUF_SIZE] = {0xde, 0xad};
uint8_t slave_read_buffer = 0;
@ -330,7 +341,7 @@ TEST_CASE_MULTIPLE_DEVICES("I2CMaster Composed transfer", "[cxx i2c][test_env=UT
static void i2c_slave_write_multiple_raw_bytes_twice(void)
{
I2CSlave slave(1, I2C_SLAVE_SCL_IO, I2C_SLAVE_SDA_IO, ADDR, 512, 512);
I2CSlave slave(I2C_SLAVE_NUM, I2C_SLAVE_SCL_IO, I2C_SLAVE_SDA_IO, ADDR, 512, 512);
const size_t BUF_SIZE = 8;
uint8_t WRITE_BUFFER [BUF_SIZE] = {0, 1, 2, 3, 4, 5, 6, 7};
@ -350,7 +361,7 @@ static void i2c_master_reuse_read_multiple_raw_bytes(void)
unity_send_signal("master init");
unity_wait_for_signal("slave write");
const size_t BUF_SIZE = 8;
#if !CONFIG_IDF_TARGET_ESP32C3
std::shared_ptr<I2CRead> reader(new I2CRead(BUF_SIZE));
future<vector<uint8_t> > fut;
@ -368,6 +379,22 @@ static void i2c_master_reuse_read_multiple_raw_bytes(void)
TEST_ASSERT_EQUAL(i, data1[i]);
TEST_ASSERT_EQUAL(i, data2[i]);
}
#else // Cannot read twice because the `prefetch` behaviour on C3.
std::shared_ptr<I2CRead> reader(new I2CRead(BUF_SIZE * 2));
future<vector<uint8_t> > fut;
fut = fix.master->transfer(reader, ADDR);
vector<uint8_t> data = fut.get();
unity_send_signal("master read done");
TEST_ASSERT_EQUAL(BUF_SIZE * 2, data.size());
for (int i = 0; i < BUF_SIZE; i++) {
TEST_ASSERT_EQUAL((i % BUF_SIZE), data[i]);
}
#endif // !CONFIG_IDF_TARGET_ESP32C3
}
TEST_CASE_MULTIPLE_DEVICES("I2CMaster reuse read multiple bytes", "[cxx i2c][test_env=UT_T2_I2C][timeout=150]",
@ -414,7 +441,7 @@ TEST_CASE_MULTIPLE_DEVICES("I2CMaster reuse write multiple bytes", "[cxx i2c][te
static void i2c_slave_composed_trans_twice(void)
{
I2CSlave slave(1, I2C_SLAVE_SCL_IO, I2C_SLAVE_SDA_IO, ADDR, 512, 512);
I2CSlave slave(I2C_SLAVE_NUM, I2C_SLAVE_SCL_IO, I2C_SLAVE_SDA_IO, ADDR, 512, 512);
size_t BUF_SIZE = 2;
const uint8_t SLAVE_WRITE_BUFFER1 [BUF_SIZE] = {0xde, 0xad};
const uint8_t SLAVE_WRITE_BUFFER2 [BUF_SIZE] = {0xbe, 0xef};
@ -429,8 +456,10 @@ static void i2c_slave_composed_trans_twice(void)
TEST_ASSERT_EQUAL(1, slave.read_raw(&slave_read_buffer, 1, chrono::milliseconds(1000)));
TEST_ASSERT_EQUAL(MAGIC_TEST_NUMBER, slave_read_buffer);
#if !CONFIG_IDF_TARGET_ESP32C3
TEST_ASSERT_EQUAL(1, slave.read_raw(&slave_read_buffer, 1, chrono::milliseconds(1000)));
TEST_ASSERT_EQUAL(MAGIC_TEST_NUMBER, slave_read_buffer);
#endif // !CONFIG_IDF_TARGET_ESP32C3
}
static void i2c_master_reuse_composed_trans(void)
@ -442,6 +471,7 @@ static void i2c_master_reuse_composed_trans(void)
std::shared_ptr<I2CComposed> composed_transfer(new I2CComposed);
composed_transfer->add_write({47u});
#if !CONFIG_IDF_TARGET_ESP32C3
composed_transfer->add_read(BUF_SIZE);
unity_wait_for_signal("slave init");
@ -461,9 +491,31 @@ static void i2c_master_reuse_composed_trans(void)
TEST_ASSERT_EQUAL(SLAVE_WRITE_BUFFER1[i], read_data1[0][i]);
TEST_ASSERT_EQUAL(SLAVE_WRITE_BUFFER2[i], read_data2[0][i]);
}
#else // Cannot read twice because the `prefetch` behaviour on C3.
composed_transfer->add_read(BUF_SIZE * 2);
unity_wait_for_signal("slave init");
vector<vector<uint8_t> > read_data = fix.master->transfer(composed_transfer, ADDR).get();
unity_send_signal("master transfer");
TEST_ASSERT_EQUAL(1, read_data.size());
TEST_ASSERT_EQUAL(4, read_data[0].size());
for (int i = 0; i < BUF_SIZE; i++) {
TEST_ASSERT_EQUAL(SLAVE_WRITE_BUFFER1[i], read_data[0][i]);
}
for (int i = BUF_SIZE; i < BUF_SIZE * 2; i++) {
TEST_ASSERT_EQUAL(SLAVE_WRITE_BUFFER2[i - BUF_SIZE], read_data[0][i]);
}
#endif //!CONFIG_IDF_TARGET_ESP32C3
}
TEST_CASE_MULTIPLE_DEVICES("I2CMaster reuse composed transfer", "[cxx i2c][test_env=UT_T2_I2C][timeout=150]",
i2c_master_reuse_composed_trans, i2c_slave_composed_trans_twice);
#endif //TEMPORARY_DISABLED_FOR_TARGETS(ESP32S2, ESP32S3, ESP32C3)
#endif //TEMPORARY_DISABLED_FOR_TARGETS(ESP32S2, ESP32S3)
#endif // __cpp_exceptions

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@ -601,7 +601,7 @@ UT_C3:
UT_C3_FLASH:
extends: .unit_test_c3_template
parallel: 3
parallel: 2
tags:
- ESP32C3_IDF
- UT_T1_ESP_FLASH
@ -613,6 +613,12 @@ UT_C3_SPI_DUAL:
- ESP32C3_IDF
- Example_SPI_Multi_device
UT_C3_I2C:
extends: .unit_test_c3_template
tags:
- ESP32C3_IDF
- UT_T2_I2C
nvs_compatible_test:
extends: .integration_test_template
artifacts: