diff --git a/docs/en/api-guides/unit-tests.rst b/docs/en/api-guides/unit-tests.rst index 3e1fb25758..44a4e0a64d 100644 --- a/docs/en/api-guides/unit-tests.rst +++ b/docs/en/api-guides/unit-tests.rst @@ -129,8 +129,8 @@ Change into tools/unit-test-app directory to configure and build it: * `idf.py menuconfig` - configure unit test app. * `idf.py -T all build` - build unit test app with tests for each component having tests in the ``test`` subdirectory. -* `idf.py -T xxx build` - build unit test app with tests for specific components. -* `idf.py -T all -E xxxbuild` - build unit test app with all unit tests, except for unit tests of some components. (For instance: `idf.py -T all -E ulp mbedtls build` - build all unit tests exludes ulp and mbedtls components). +* `idf.py -T "xxx yyy" build` - build unit test app with tests for some space-separated specific components (For instance: ``idf.py -T heap build`` - build unit tests only for ``heap`` component directory). +* `idf.py -T all -E "xxx yyy" build` - build unit test app with all unit tests, except for unit tests of some components (For instance: ``idf.py -T all -E "ulp mbedtls" build`` - build all unit tests exludes ``ulp`` and ``mbedtls`` components). When the build finishes, it will print instructions for flashing the chip. You can simply run ``idf.py flash`` to flash all build output. diff --git a/docs/zh_CN/api-guides/unit-tests.rst b/docs/zh_CN/api-guides/unit-tests.rst index 960238e72f..43a1e7d6fd 100644 --- a/docs/zh_CN/api-guides/unit-tests.rst +++ b/docs/zh_CN/api-guides/unit-tests.rst @@ -155,11 +155,11 @@ DUT2(slave)终端: - ``idf.py -T all build`` - 编译单元测试程序,测试每个组件 ``test`` 子目录下的用例。 -- ``idf.py -T xxx build`` - 编译单元测试程序,测试指定的组件。 +- ``idf.py -T "xxx yyy" build`` - 编译单元测试程序,测试指定的组件。 -- ``idf.py -T all -E xxx build`` - +- ``idf.py -T all -E "xxx yyy" build`` - 编译单元测试程序,测试所有(除开指定)的组件。例如 - ``idf.py -T all -E ulp mbedtls build`` - + ``idf.py -T all -E "ulp mbedtls" build`` - 编译所有的单元测试,不包括 ``ulp`` 和 ``mbedtls``\ 组件。 当编译完成时,它会打印出烧写芯片的指令。您只需要运行 ``idf.py flash``