test(i2c_master): makeup a write-large read-small test for known reason

This commit is contained in:
C.S.M 2024-05-16 14:55:59 +08:00
parent ce7f095ddf
commit 133bda4966

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@ -140,7 +140,7 @@ TEST_CASE_MULTIPLE_DEVICES("I2C master write slave test", "[i2c][test_env=generi
static void i2c_master_write_test_large_write_small_read(void)
{
uint8_t data_wr[DATA_LENGTH] = { 0 };
uint8_t data_wr[35] = { 0 }; // IDFCI-2151 Temporarily make up this test.
int i;
i2c_master_bus_config_t i2c_mst_config = {
@ -166,12 +166,12 @@ static void i2c_master_write_test_large_write_small_read(void)
unity_wait_for_signal("i2c slave init finish");
unity_send_signal("master write");
for (i = 0; i < DATA_LENGTH; i++) {
for (i = 0; i < 35; i++) {
data_wr[i] = i;
}
disp_buf(data_wr, i);
TEST_ESP_OK(i2c_master_transmit(dev_handle, data_wr, DATA_LENGTH, -1));
TEST_ESP_OK(i2c_master_transmit(dev_handle, data_wr, 35, -1));
unity_wait_for_signal("ready to delete");
TEST_ESP_OK(i2c_master_bus_rm_device(dev_handle));