esp-idf/components/esp_driver_sdspi/test_apps/sdspi/pytest_sdspi.py

# SPDX-FileCopyrightText: 2022-2024 Espressif Systems (Shanghai) CO LTD
# SPDX-License-Identifier: CC0-1.0
import pytest
from pytest_embedded_idf import IdfDut


@pytest.mark.esp32
@pytest.mark.esp32c3
@pytest.mark.esp32c5
@pytest.mark.sdcard_spimode
def test_sdspi(dut: IdfDut) -> None:
    dut.run_all_single_board_cases(reset=True)
feat(sdspi): support sdspi on c5 2024-08-08 16:23:30 +08:00			`# SPDX-FileCopyrightText: 2022-2024 Espressif Systems (Shanghai) CO LTD`
refactor(sdspi): added component pytest cases and enabled them on CI 2023-11-27 19:26:34 +08:00			`# SPDX-License-Identifier: CC0-1.0`
feat(sdspi): support sdspi on c5 2024-08-08 16:23:30 +08:00			`import pytest`
refactor(sdspi): added component pytest cases and enabled them on CI 2023-11-27 19:26:34 +08:00			`from pytest_embedded_idf import IdfDut`


feat(sdspi): support sdspi on c5 2024-08-08 16:23:30 +08:00			`@pytest.mark.esp32`
			`@pytest.mark.esp32c3`
			`@pytest.mark.esp32c5`
			`@pytest.mark.sdcard_spimode`
refactor(sdspi): added component pytest cases and enabled them on CI 2023-11-27 19:26:34 +08:00			`def test_sdspi(dut: IdfDut) -> None:`
ci(sdspi): clean up newlib memory, reset between tests Two changes to make the tests less susceptible to random failures: - Free up newlib memory to not have false-positive memory leaks due to lazy allocations in reent structure - Reset between tests, so that one failing test doesn't cause subsequent tests to fail Both changes are already applied to esp_driver_sdmmc test app. 2024-05-02 16:42:01 +02:00			`dut.run_all_single_board_cases(reset=True)`