esp-idf/components/idf_test/integration_test/KnownIssues


# BT heap size issue
ESP32.BTSTK_MISC_0301

# GATT read multiple
ESP32.BTSTK_GATT_27002
ESP32.BTSTK_GATT_27003

ESP32.BLUEDROID_GAP_04005
ESP32.BLUEDROID_GAP_05002
ESP32.BLUEDROID_GAP_05003
ESP32.BTSTK_MISC_0504
ESP32.BTSTK_MISC_0505
ESP32.BTSTK_MISC_0506
ESP32.BTSTK_MISC_0507
update current known issue for ESP32 IDF test 2016-09-29 20:20:40 +08:00
test: update ci test case 2017-12-18 19:24:09 +08:00			`# BT heap size issue`
test: sync integration test cases 2019-04-02 10:00:12 +08:00			`ESP32.BTSTK_MISC_0301`
CI: add BLE test cases to CI 2017-06-23 18:06:30 +08:00
test: split CI test environment: Currently CI test environment is complicated, usually includes NIC, AP. These devices are not used for a lot test cases. Therefore we split the test environment, remove unnecessary devices. Then it will be easier to create CI runners. 2018-08-26 12:15:51 +08:00			`# GATT read multiple`
test: sync integration test cases 2019-04-02 10:00:12 +08:00			`ESP32.BTSTK_GATT_27002`
			`ESP32.BTSTK_GATT_27003`
test: move auto test script to new repo (backport) + known issue 2020-10-24 09:25:33 +08:00
			`ESP32.BLUEDROID_GAP_04005`
			`ESP32.BLUEDROID_GAP_05002`
			`ESP32.BLUEDROID_GAP_05003`
			`ESP32.BTSTK_MISC_0504`
			`ESP32.BTSTK_MISC_0505`
			`ESP32.BTSTK_MISC_0506`
			`ESP32.BTSTK_MISC_0507`